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GRAZING INCIDENCE X-RAY REFLECTANCE MEASUREMENT OF SURFACE AND INTERFACE ROUGHNESS ON THE SUB-NANOMETRE SCALE
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UNSPECIFIED (1994) GRAZING INCIDENCE X-RAY REFLECTANCE MEASUREMENT OF SURFACE AND INTERFACE ROUGHNESS ON THE SUB-NANOMETRE SCALE. In: Symposium on Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy, BOSTON, MA, NOV 29-DEC 03, 1993. Published in: DETERMINING NANOSCALE PHYSICAL PROPERTIES OF MATERIALS BY MICROSCOPY AND SPECTROSCOPY, 332 pp. 525-530. ISBN 1-55899-231-6. ISSN 0272-9172.
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Item Type: | Conference Item (UNSPECIFIED) | ||||
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Subjects: | T Technology > TA Engineering (General). Civil engineering (General) | ||||
Series Name: | MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS | ||||
Journal or Publication Title: | DETERMINING NANOSCALE PHYSICAL PROPERTIES OF MATERIALS BY MICROSCOPY AND SPECTROSCOPY | ||||
Publisher: | MATERIALS RESEARCH SOC | ||||
ISBN: | 1-55899-231-6 | ||||
ISSN: | 0272-9172 | ||||
Editor: | Sarikaya, M and Wickramasinghe, HK and Isaacson, M | ||||
Official Date: | 1994 | ||||
Dates: |
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Volume: | 332 | ||||
Number of Pages: | 6 | ||||
Page Range: | pp. 525-530 | ||||
Publication Status: | Published | ||||
Title of Event: | Symposium on Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy | ||||
Location of Event: | BOSTON, MA | ||||
Date(s) of Event: | NOV 29-DEC 03, 1993 |
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