The Library
A SCANNING ELECTRON-MICROSCOPE BASED MICROINDENTATION SYSTEM
Tools
UNSPECIFIED (1994) A SCANNING ELECTRON-MICROSCOPE BASED MICROINDENTATION SYSTEM. REVIEW OF SCIENTIFIC INSTRUMENTS, 65 (3). pp. 632-638. ISSN 0034-6748.
Research output not available from this repository.
Request-a-Copy directly from author or use local Library Get it For Me service.
Abstract
The design and characterization of a scanning electron microscope based microindentor is presented. Dynamic, high magnification imaging of the indentor-specimen contact zone is possible, permitting observation of indent events. Applied load as a function of indentor tip displacement is continuously monitored during indentation. The maximum applied load capability of 20 N is measured to a resolution of 1 mN with a piezoelectric transducer mounted on the indentor shaft. Displacement is measured with a specially developed capacitance gauge that is again mounted on the indentor shaft near the indentor tip and records tip displacement with respect to the specimen surface to a resolution of 10 nm over a 100 mum range. The instrument is vacuum compatible, capable of remote operation, has a short measurement loop, and a potentially high bandwidth response. Results from a fiber push-down test on a SiC fiber reinforced glass ceramic are reported to illustrate the capability of the instrument in performing measurements across the nanoindentation and microindentation ranges.
Item Type: | Journal Article | ||||
---|---|---|---|---|---|
Subjects: | Q Science > QC Physics | ||||
Journal or Publication Title: | REVIEW OF SCIENTIFIC INSTRUMENTS | ||||
Publisher: | AMER INST PHYSICS | ||||
ISSN: | 0034-6748 | ||||
Official Date: | March 1994 | ||||
Dates: |
|
||||
Volume: | 65 | ||||
Number: | 3 | ||||
Number of Pages: | 7 | ||||
Page Range: | pp. 632-638 | ||||
Publication Status: | Published |
Data sourced from Thomson Reuters' Web of Knowledge
Request changes or add full text files to a record
Repository staff actions (login required)
View Item |