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SUB-NANOMETER DISPLACEMENTS CALIBRATION USING X-RAY INTERFEROMETRY
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UNSPECIFIED (1990) SUB-NANOMETER DISPLACEMENTS CALIBRATION USING X-RAY INTERFEROMETRY. MEASUREMENT SCIENCE & TECHNOLOGY, 1 (2). pp. 107-119. ISSN 0957-0233.
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Item Type: | Journal Article | ||||
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Subjects: | T Technology > TA Engineering (General). Civil engineering (General) | ||||
Journal or Publication Title: | MEASUREMENT SCIENCE & TECHNOLOGY | ||||
Publisher: | IOP PUBLISHING LTD | ||||
ISSN: | 0957-0233 | ||||
Official Date: | February 1990 | ||||
Dates: |
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Volume: | 1 | ||||
Number: | 2 | ||||
Number of Pages: | 13 | ||||
Page Range: | pp. 107-119 | ||||
Publication Status: | Published |
Data sourced from Thomson Reuters' Web of Knowledge
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