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THE DEPTH RESOLUTION OF SECONDARY ION MASS SPECTROMETERS - A CRITICAL-EVALUATION
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UNSPECIFIED (1988) THE DEPTH RESOLUTION OF SECONDARY ION MASS SPECTROMETERS - A CRITICAL-EVALUATION. SCANNING MICROSCOPY, 2 (2). pp. 639-652.
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Item Type: | Journal Item | ||||
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Subjects: | Q Science > QH Natural history | ||||
Journal or Publication Title: | SCANNING MICROSCOPY | ||||
Publisher: | SCANNING MICROSCOPY INT | ||||
ISSN: | 0891-7035 | ||||
Official Date: | June 1988 | ||||
Dates: |
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Volume: | 2 | ||||
Number: | 2 | ||||
Number of Pages: | 14 | ||||
Page Range: | pp. 639-652 | ||||
Publication Status: | Published |
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