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Non-additivity of multiply charged ion emission from Si and Al produced by molecular projectiles
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UNSPECIFIED (2004) Non-additivity of multiply charged ion emission from Si and Al produced by molecular projectiles. In: 16th International Conference on Ion Beam Analysis, Albuquerque, NM, JUN 29-JUL 04, 2003. Published in: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 219-20 pp. 278-283. doi:10.1016/j.nimb.2004.01.068 ISSN 0168-583X.
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Official URL: http://dx.doi.org/10.1016/j.nimb.2004.01.068
Abstract
Experiments are reported on the non-additivity of a multiply charged ion emission with various atomic and molecular projectiles. A distinction has been found in the non-additivity of the Si2+ emission from Si. It manifests itself as a change of the non-additivity factor K-2.1 from K-2.1 < 1 (sub-linear effect) to K-2.1 > 1 (non-additive enhancement effect) in going from Au-2(-) to Cu-2(-) projectiles. It was shown that the sub-linear behaviour of K-2.1 is caused by the correlated move of projectiles gold atoms in a target matter (the clearing-the-way effect) and the origin of the nonadditive enhancement is not determined by non-linear cascade sputtering. On the basis of the results obtained a new effect in an ion-induced atomic-like Auger electron emission has been predicted. (C) 2004 Elsevier B.V. All rights reserved.
Item Type: | Conference Item (UNSPECIFIED) | ||||
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Subjects: | Q Science > QC Physics | ||||
Journal or Publication Title: | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | ||||
Publisher: | ELSEVIER SCIENCE BV | ||||
ISSN: | 0168-583X | ||||
Official Date: | June 2004 | ||||
Dates: |
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Volume: | 219-20 | ||||
Number of Pages: | 6 | ||||
Page Range: | pp. 278-283 | ||||
DOI: | 10.1016/j.nimb.2004.01.068 | ||||
Publication Status: | Published | ||||
Title of Event: | 16th International Conference on Ion Beam Analysis | ||||
Location of Event: | Albuquerque, NM | ||||
Date(s) of Event: | JUN 29-JUL 04, 2003 |
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