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Maximum entropy mobility spectrum analysis for magnetotransport characterization of semiconductor multilayer structures
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UNSPECIFIED (2001) Maximum entropy mobility spectrum analysis for magnetotransport characterization of semiconductor multilayer structures. In: 25th International Semiconductor Conference, SINAIA, ROMANIA, OCT 08-12, 2002. Published in: CAS: 2002 INTERNATIONAL SEMICONDUCTOR CONFERENCE, VOLS 1 AND 2, PROCEEDINGS pp. 415-418. ISBN 0-7803-7440-1.
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Abstract
The maximum entropy mobility spectrum analysis (ME-MSA) method has been developed on the basis of a maximum entropy (ME) principle. It allows to calculate a smooth electrical conductivity versus mobility plot ("mobility spectrum") from the classical magnetoconductivity tensor in semiconductor multilayer structures. The advantages of the ME-MSA as compared to the MSA are demonstrated using a synthetic data set.
Item Type: | Conference Item (UNSPECIFIED) | ||||
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Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering Q Science > QC Physics |
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Journal or Publication Title: | CAS: 2002 INTERNATIONAL SEMICONDUCTOR CONFERENCE, VOLS 1 AND 2, PROCEEDINGS | ||||
Publisher: | IEEE | ||||
ISBN: | 0-7803-7440-1 | ||||
Official Date: | 2001 | ||||
Dates: |
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Number of Pages: | 4 | ||||
Page Range: | pp. 415-418 | ||||
Publication Status: | Published | ||||
Title of Event: | 25th International Semiconductor Conference | ||||
Location of Event: | SINAIA, ROMANIA | ||||
Date(s) of Event: | OCT 08-12, 2002 |
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