Conference Item

Belikh, S. F., Palitsin, V., Veryovkin, I. V., Kovarsky, A. P., Chang, R. J. H., Adriaens, A. (Annemie), Dowsett, M. and Adams, F. (2006) Caesium sputter ion source compatible with commercial SIMS instruments. In: 15th International Conference on Secondary Ion Mass Spectrometry (SIMS XV), Univ Manchester, Manchester, 12-16 Sep 2005. Published in: Applied Surface Science, Volume 252 (Number 19 ). pp. 7321-7325. ISSN 0169-4332. doi:10.1016/j.apsusc.2006.02.172