Journal Article

Bailey, L. R. (Laura R.), Veal, T. D. (Tim D.), Kendrick, C. E., Durbin, S. M. and McConville, C. F. (Chris F.) (2009) Sulfur passivation of InN surface electron accumulation. Applied Physics Letters, Vol.95 (No.19). Article no. 192111. doi:10.1063/1.3263725

Bailey, L. R. (Laura R.), Veal, T. D. (Tim D.), King, P. D. C., McConville, C. F. (Chris F.), Pereiro, J., Grandal, J., Sanchez-Garcia, M. A., Munoz, E. and Calleja, E. (2008) Band bending at the surfaces of In-rich InGaN alloys. Journal of Applied Physics, Vol.104 (No.11). doi:10.1063/1.3033373

Veal, T. D. (Tim D.), King, Philip David, Hatfield, S. A., Bailey, L. R. (Laura R.), McConville, C. F. (Chris F.), Martel, B., Moreno, J. C., Frayssinet, E., Semond, F. and Zúñiga-Pérez, J. (2008) Valence band offset of the ZnO/AlN heterojunction determined by X-ray photoemission spectroscopy. Applied Physics Letters, Vol.93 (No.20). p. 202108. doi:10.1063/1.3032911

King, P. D. C., Veal, T. D. (Tim D.), Gallinat, C. S., Koblmueller, G., Bailey, L. R. (Laura R.), Speck, James S. and McConville, C. F. (Chris F.) (2008) Influence of growth conditions and polarity on interface-related electron density in InN. Journal of Applied Physics, Vol.104 (No.10). doi:10.1063/1.3020528

King, P. D. C., Veal, T. D. (Tim D.), Kendrick, C. E., Bailey, L. R. (Laura R.), Durbin, Steven M. and McConville, C. F. (Chris F.) (2008) InN/GaN valence band offset : high-resolution x-ray photoemission spectroscopy measurements. Physical Review B (Condensed Matter and Materials Physics), Volume 78 (Number 3). Article number 033308. doi:10.1103/PhysRevB.78.033308

King, Philip David, Veal, T. D., Adikimenakis, A., Lu, H., Bailey, L. R., Iliopoulos, E., Georgakilas, A., Schaff, William Joseph and McConville, C. F. (2008) Surface electronic properties of undoped InAlN alloys. Applied Physics Letters, Vol.92 (No.17). p. 172105. doi:10.1063/1.2913765