2019

Tian, Yanling, Cai, Kunhai, Zhang, Dawei, Liu, Xianping, Wang, Fujun and Shirinzadeh, Bijan (2019) Development of a XYZ scanner for home-made atomic force microscope based on FPAA control. Mechanical Systems and Signal Processing, 131 . pp. 222-242. doi:10.1016/j.ymssp.2019.05.057

Cai, Kunhai, Tian, Yanling, Liu, Xianping, Zhang, Dawei, Shang, Jiangkun and Shirinzadeh, Bijan (2019) Development and control methodologies for 2-DOF micro/nano positioning stage with high out-of-plane payload capacity. Robotics and Computer-Integrated Manufacturing, 56 . pp. 95-105. doi:10.1016/j.rcim.2018.08.007

2018

Cai, Kunhai, He, Xianbin, Tian, Yanling, Liu, Xianping, Zhang, Dawei and Shirinzadeh, Bijan (2018) Design of a XYZ Scanner for home-made high-speed atomic force microscopy. Microsystem Technologies, 24 (7). pp. 3123-3132. doi:10.1007/s00542-017-3674-4

Cai, Kunhai, He, Xianbin, Tian, Yanling, Liu, Xianping, Zhang, Dawei and Shirinzadeh, Bijan (2018) Design of a XYZ scanner for home-made high-speed atomic force microscopy. Microsystem Technologies, 24 (7). pp. 3123-3132. doi:10.1007/s00542-017-3674-4

Cai, Kunhai, Tian, Yanling, Liu, Xianping, Fatikow, S., Wang, Fujun, Cui, Liangyu, Zhang, Dawei and Shirinzadeh, Bijan (2018) Modeling and controller design of a 6-DOF precision positioning system. Mechanical Systems and Signal Processing, 104 . pp. 536-555. doi:10.1016/j.ymssp.2017.11.002

Cai, Kunhai, He, Xianbin, Tian, Yanling, Liu, Xianping and Cui, Liangyu (2018) Development and testing of a XYZ scanner for atomic force microscope. In: Eskola, Hannu and Väisänen, Outi and Viik, Jari and Hyttinen, Jari, (eds.) EMBEC & NBC 2017. IFMBE Proceedings, 65 . Singapore: Springer, pp. 326-329. ISBN 9789811051210