Number of items: 5.
Renz, Arne Benjamin, Vavasour, Oliver James, Shah, Vishal Ajit, Pathirana, Vasantha, Trajkovic, Tanya, Bonyadi, Yeganeh, Wu, Ruizhu, Ortiz-Gonzalez, Jose Angel , Rong, Xiaoyun, Baker, Guy, Mawby, Philip. A. and Gammon, Peter M.
(2021)
3.3 kV SiC JBS diodes employing a P2O5 surface passivation treatment to improve electrical characteristics.
In: 2021 IEEE Energy Conversion Congress and Exposition (ECCE), Vancouver, BC, Canada, 10-14 Oct 2021
pp. 5283-5288.
doi:10.1109/ECCE47101.2021.9594999
ISSN 2329-3721.
Renz, A. B., Shah, V. A., Vavasour, Oliver J., Bonyadi, Yeganeh, Li, Fan, Dai, Tianxiang, Baker, G. W. C., Hindmarsh, Steven A., Han, Yan, Walker, Marc, Sharma, Y., Liu, Y., Raghothamachar, B., Dudley, M., Mawby, P. A. (Philip A.) and Gammon, P. M.
(2020)
The improvement of Mo/4H-SiC Schottky diodes via a P2O5 surface passivation treatment.
Journal of Applied Physics, 127
(2).
025704.
doi:10.1063/1.5133739
ISSN 0021-8979.
Bonyadi, Yeganeh
(2019)
Fabrication and analysis of 4H-SiC diodes.
PhD thesis, University of Warwick.
Davletzhanova, Zarina, Alatise, Olayiwola M., Bonyadi, Roozbeh, Gonzalez, Jose Ortiz, Chan, Chun Wa, Bonyadi, Yeganeh, Jennings, Mike and Mawby, P. A. (Philip A.)
(2018)
Impact of Leakage Currents on Voltage Sharing in Series Connected SiC Power MOSFETs and Silicon IGBT Devices.
In: 20th European Conference on Power Electronics and Applications, Riga, Latvia, 17-21 September 2018. Published in: 2018 20th European Conference on Power Electronics and Applications (EPE'18 ECCE Europe)
ISBN 9781538641453 .
Bonyadi, Yeganeh, Gammon, P. M., Bonyadi, Roozbeh, Shah, V. A., Fisher, C. A., Martin, David M. and Mawby, Philip A.
(2016)
Characterization of 4H-SiC PiN diodes formed on defects identified by PL imaging.
Materials Science Forum, 858
.
pp. 405-409.
doi:10.4028/www.scientific.net/msf.858.405
ISSN 1662-9752.
This list was generated on Thu Apr 25 21:36:23 2024 BST.