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Number of items: 5.
2021
Renz, Arne Benjamin, Vavasour, Oliver James, Shah, Vishal Ajit, Pathirana, Vasantha, Trajkovic, Tanya, Bonyadi, Yeganeh, Wu, Ruizhu, Ortiz-Gonzalez, Jose Angel , Rong, Xiaoyun, Baker, Guy, Mawby, Philip. A. and Gammon, Peter M. (2021) 3.3 kV SiC JBS diodes employing a P2O5 surface passivation treatment to improve electrical characteristics. In: 2021 IEEE Energy Conversion Congress and Exposition (ECCE), Vancouver, BC, Canada, 10-14 Oct 2021 pp. 5283-5288. doi:10.1109/ECCE47101.2021.9594999 ISSN 2329-3721.
2020
Renz, A. B., Shah, V. A., Vavasour, Oliver J., Bonyadi, Yeganeh, Li, Fan, Dai, Tianxiang, Baker, G. W. C., Hindmarsh, Steven A., Han, Yan, Walker, Marc, Sharma, Y., Liu, Y., Raghothamachar, B., Dudley, M., Mawby, P. A. (Philip A.) and Gammon, P. M. (2020) The improvement of Mo/4H-SiC Schottky diodes via a P2O5 surface passivation treatment. Journal of Applied Physics, 127 (2). 025704. doi:10.1063/1.5133739 ISSN 0021-8979.
2019
Bonyadi, Yeganeh (2019) Fabrication and analysis of 4H-SiC diodes. PhD thesis, University of Warwick.
2018
Davletzhanova, Zarina, Alatise, Olayiwola M., Bonyadi, Roozbeh, Gonzalez, Jose Ortiz, Chan, Chun Wa, Bonyadi, Yeganeh, Jennings, Mike and Mawby, P. A. (Philip A.) (2018) Impact of Leakage Currents on Voltage Sharing in Series Connected SiC Power MOSFETs and Silicon IGBT Devices. In: 20th European Conference on Power Electronics and Applications, Riga, Latvia, 17-21 September 2018. Published in: 2018 20th European Conference on Power Electronics and Applications (EPE'18 ECCE Europe) ISBN 9781538641453 .
2016
Bonyadi, Yeganeh, Gammon, P. M., Bonyadi, Roozbeh, Shah, V. A., Fisher, C. A., Martin, David M. and Mawby, Philip A. (2016) Characterization of 4H-SiC PiN diodes formed on defects identified by PL imaging. Materials Science Forum, 858 . pp. 405-409. doi:10.4028/www.scientific.net/msf.858.405 ISSN 1662-9752.
This list was generated on Thu Apr 18 23:47:23 2024 BST.