Number of items: 2.
2020
Agbo, S. N., Ortiz Gonzalez, Jose Angel, Wu, R., Jahdi, S. and Alatise, Olayiwola M.
(2020)
UIS performance and ruggedness of stand-alone and cascode SiC JFETs.
Microelectronics Reliability
.
113803.
doi:10.1016/j.microrel.2020.113803
(In Press)
Agbo, S. N., Ortiz-Gonzalez, Jose Angel and Alatise, Olayiwola M.
(2020)
Performance of SiC cascode JFETs under single and repetitive avalanche pulses.
Microelectronics Reliability, 110
.
113644.
doi:10.1016/j.microrel.2020.113644
(In Press)
This list was generated on Tue Dec 1 21:48:18 2020 GMT.
