2022

Ortiz Gonzalez, Jose Angel, Deb, A., Bashar, Erfan, Agbo, S. N., Jahdi, S. and Alatise, Olayiwola M. (2022) Benchmarking the robustness of Si and SiC MOSFETs : unclamped inductive switching and short-circuit performance. Microelectronics Reliability, 138 . 114719. doi:10.1016/j.microrel.2022.114719 ISSN 00262714.

2021

Agbo, Sunday Nereus, Bashar, Erfan, Wu, Ruizhu, Mendy, Simon, Gonzalez, Jose Ortiz and Alatise, Olayiwola M. (2021) Simulations and measurements of failure modes in SiC Cascode JFETs under short circuit conditions. In: 2021 IEEE 22nd Workshop on Control and Modelling of Power Electronics (COMPEL), Cartagena, Colombia, 2-5 Nov 2021. Published in: 2021 IEEE 22nd Workshop on Control and Modelling of Power Electronics (COMPEL) pp. 1-7. doi:10.1109/COMPEL52922.2021.9646031 ISSN 1093-5142.

Wu, Ruizhu, Agbo, S. N., Mendy, Simon, Bashar, E., Jahdi, S., Ortiz Gonzalez, Jose Angel and Alatise, Olayiwola M. (2021) Measurement and simulation of short circuit current sharing under parallel connection : SiC MOSFETs and SiC Cascode JFETs. Microelectronics Reliability, 126 . 114271. doi:10.1016/j.microrel.2021.114271 ISSN 0026-2714.

2020

Agbo, S. N., Ortiz Gonzalez, Jose Angel, Wu, R., Jahdi, S. and Alatise, Olayiwola M. (2020) UIS performance and ruggedness of stand-alone and cascode SiC JFETs. Microelectronics Reliability, 114 . 113803. doi:10.1016/j.microrel.2020.113803 ISSN 0026-2714.

Agbo, S. N., Ortiz-Gonzalez, Jose Angel and Alatise, Olayiwola M. (2020) Performance of SiC cascode JFETs under single and repetitive avalanche pulses. Microelectronics Reliability, 110 . 113644. doi:10.1016/j.microrel.2020.113644 ISSN 0026-2714.