2012

Claus, Daniel, Robinson, David J., Chetwynd, D. G., Yang, Shuo, Pike, W. Thomas and Rodenburg, John M. (2012) Ptychography applied to optical metrology. In: 5th International Conference on Speckle Metrology, Speckle 2012, Vigo, Spain, 10-12 Sept 2012. Published in: Proceedings of SPIE - The International Society for Optical Engineering, Volume 8413 Article number 84130O. ISSN 0277-786X. doi:10.1117/12.977959