Number of items: 1.
2012
Claus, Daniel, Robinson, David J., Chetwynd, D. G., Yang, Shuo, Pike, W. Thomas and Rodenburg, John M.
(2012)
Ptychography applied to optical metrology.
In: 5th International Conference on Speckle Metrology, Speckle 2012, Vigo, Spain, 10-12 Sept 2012. Published in: Proceedings of SPIE - The International Society for Optical Engineering, Volume 8413
Article number 84130O.
ISSN 0277-786X.
doi:10.1117/12.977959
This list was generated on Sat Jan 18 13:23:38 2020 GMT.
