Pandey, Priyanka A., Rochford, L. A., Keeble, Dean Samuel, Rourke, Jonathan P., Jones, Tim S., Beanland, Richard and Wilson, Neil R.. (2012) Resolving the nanoscale morphology and crystallographic structure of molecular thin films : F16CuPc on graphene oxide. Chemistry of Materials, Vol.24 (No.7). pp. 1365-1370. ISSN 0897-4756

Morris, R. J. H. (Richard J. H.), Dowsett, M. G., Beanland, Richard, Dobbie, A. (Andrew), Myronov, Maksym and Leadley, D. R. (David R.). (2012) Overcoming low Ge ionization and erosion rate variation for quantitative ultralow energy secondary ion mass spectrometry depth profiles of Si1–xGex/Ge quantum well structures. Analytical Chemistry, Vol.84 (No.5). pp. 2292-2298. ISSN 0003-2700

Aldous, J. D. (James D.), Burrows, C. W., Sanchez, A. M., Beanland, Richard, Maskery, I. (Ian), Bradley, M. K. (Matthew K.), Dias, Manuel dos Santos, Staunton, J. B. and Bell, Gavin R.. (2012) Cubic MnSb : epitaxial growth of a predicted room temperature half-metal. Physical Review B, Vol.85 (No.6). Article no. 060403(R). ISSN 1098-0121

Morris, R. J. H. (Richard J. H.), Dowsett, M. G., Beanland, R., Dobbie, A. (Andrew), Myronov, M. and Leadley, D. R. (David R.) (2012) O2+ probe-sample conditions for ultra low energy SIMS depth profiling of nanometre scale Si0.4Ge0.6/Ge quantum wells. Surface and Interface Analysis . n/a-n/a. ISSN 0142-2421 (In Press)

Chekhovich, E. A., Kavokin, K. V., Puebla, J., Krysa, A. B., Hopkinson, M., Andreev, A. D., Sanchez, A. M., Beanland, R., Skolnick, M. S. and Tartakovskii, A. I.. (2012) Structural analysis of strained quantum dots using nuclear magnetic resonance. Nature Nanotechnology, Vol. 7 (No. 10). pp. 646-650. ISSN 1748-3387

Beanland, R. and Thomas, Pam A.. (2011) Imaging planar tetragonal sheets in rhombohedral Na0.5Bi0.5TiO3 using transmission electron microscopy. Scripta Materialia, Vol.65 (No.5). pp. 440-443. ISSN 13596462

Dowsett, M. G., Morris, R. J. H. (Richard J. H.), Hand, M. (Matthew), Grigg, A. T., Walker, David, 1978- and Beanland, R.. (2011) The influence of beam energy on apparent layer thickness using ultralow energy O2+ SIMS on surface Si1−xGex. Surface and Interface Analysis, Vol.43 (No.1-2). pp. 211-213. ISSN 0142-2421

D’Souza, N., Beanland, R., Hayward, C. and Dong, H. B.. (2011) Accuracy of composition measurement using X-ray spectroscopy in precipitate-strengthened alloys : application to Ni-base superalloys. Acta Materialia, Vol.59 (No.3). pp. 1003-1013. ISSN 1359-6454

Beanland, Richard. (2011) Structure of planar defects in tilted perovskites. Acta Crystallographica Section A Foundations of Crystallography, Vol.67 (No.3). pp. 191-199. ISSN 0108-7673

Wahra, A, Tan, C -H, Xie, J, Vines, P and Beanland, R. (2011) Three-dimensional measurement of composition changes in InAs/GaAs quantum dots. Journal of Physics: Conference Series, Vol. 326 . 012048. ISSN 1742-6596 (In Press)

Wilson, Neil R., Pandey, Priyanka A., Beanland, R., Rourke, Jonathan P., Lupo, U., Rowlands, G. (George) and Roemer, Rudolf A.. (2010) On the structure and topography of free-standing chemically modified graphene. New Journal of Physics, Vol.12 . Article no. 125010 . ISSN 1367-2630

de la Mare, M., Carrington, P. J., Wheatley, R., Zhuang, Q., Beanland, R., Sanchez, A. M. and Krier, A.. (2010) Photoluminescence of InAs0.926Sb0.063N0.011/InAs multi-quantum wells in the mid-infrared spectral range. Journal of Physics D: Applied Physics, Vol.43 (No.34). Article: 345103. ISSN 0022-3727

Morris, R. J. H. (Richard J. H.), Dowsett, M. G., Beanland, R., Parbrook, P. J. and McConville, C. F. (Chris F.). (2010) Accurate ultra-low-energy secondary ion mass spectrometry analysis of wide bandgap GaN/InxGa1-xN structures using optical conductivity enhancement. Rapid Communications in Mass Spectrometry, Vol.24 (No.14). pp. 2122-2126. ISSN 0951-4198

Sanchez, A. M., Beltran, A. M., Beanland, R., Ben, T., Gass, M. H., de la Pena, F., Walls, M., Taboada, A. G., Ripalda, J. M. and Molina, S. I.. (2010) Blocking of indium incorporation by antimony in III-V-Sb nanostructures. Nanotechnology, Vol.21 (No.14). Article: 145606. ISSN 0957-4484

Makarovsky, O., Feu, W. H. M., Patane, A., Eaves, L., Zhuang, Q. D., Krier, A., Beanland, R. and Airey, R.. (2010) Hot electron transport and impact ionization in the narrow energy gap InAs1-xNx alloy. Applied Physics Letters, Vol.96 (No.5). Article: 052115. ISSN 0003-6951

Beanland, R., Sanchez, A. M., Hernandez-Garrido, J. C., Wolf, D. and Midgley, P. A.. (2010) Electron tomography of III-V quantum dots using dark field 002 imaging conditions. Journal of Microscopy, Vol.237 (No.2). pp. 148-154. ISSN 0022-2720

Wilson, Neil Richard, 1977-, Pandey, Priyanka A., Beanland, Richard, Young, Robert J., Kinloch, Ian A., Gong, Lei, Liu, Zheng, Suenaga, Kazu, Rourke, Jonathan P., York, Stephen J. and Sloan, Jeremy. (2009) Graphene oxide : structural analysis and application as a highly transparent support for electron microscopy. ACS Nano, Vol.3 (No.9). pp. 2547-2556. ISSN 1936-0851

Sanchez, A. M., Beanland, R., Hasbullah, N. F., Hopkinson, M. and David, J. P. R.. (2009) Correlation between defect density and current leakage in InAs/GaAs quantum dot-in-well structures. Journal of Applied Physics, Vol.106 (No.2). Article no. 024502. ISSN 0021-8979

Pang, H.T., Dong, H.B., Beanland, R., Stone, H.J., Rae, C.M.F., Midgley, P.A., Brewster, G. and D’Souza, N.. (2009) Microstructure and Solidification Sequence of the Interdendritic Region in a Third Generation Single-Crystal Nickel-Base Superalloy. Metallurgical and Materials Transactions A, Vol. 40 (No. 7). pp. 1660-1669. ISSN 1073-5623

Beanland, R., David, J. P. R. and Sanchez, A. M.. (2008) Quantum dots in strained layers-preventing relaxation through the precipitate hardening effect. Journal of Applied Physics, Vol.104 (No.12). ISSN 0021-8979

Beanland, R., Sánchez, A. M., Childs, D., Groom, K. M., Liu, H. Y., Mowbray, D. J. and Hopkinson, M.. (2008) Structural analysis of life tested 1.3 μm quantum dot lasers. Journal of Applied Physics, Vol.103 (No.1). Article: 014913. ISSN 0021-8979