Swan, I. R. (Ian R.), Bryant, Angus T. and Mawby, P. A. (Philip A.). (2012) Fast 3D thermal simulation of power module packaging. International Journal of Numerical Modelling : Electronic Networks, Devices and Fields, Vol.25 (No.4). pp. 378-399. ISSN 0894-3370

Donnellan, B. T., Roberts, G. J., Mawby, P. A. (Philip A.) and Bryant, Angus T.. (2012) Modelling of current sharing in paralleled current limiting superjunction MOSFETs with common gate drives. Microelectronics Reliability, Vol.52 (No.3). pp. 497-502. ISSN 0026-2714

Bryant, Angus T., Yang, Shaoyong, Mawby, P. A. (Philip A.), Xiang, Dawei, Ran, Li, Tavner, Peter and Palmer, Patrick R.. (2011) Investigation into IGBT dV/dt during turn-off and its temperature dependence. IEEE Transactions on Power Electronics, Vol.26 (No.10). pp. 3019-3031. ISSN 0885-8993

Yang, Shaoyong, Bryant, Angus T., Mawby, P. A. (Philip A.), Xiang, Dawei, Ran, Li and Tavner, Peter J., 1946-. (2011) An industry-based survey of reliability in power electronic converters. IEEE Transactions on Industry Applications, Vol.47 (No.3). pp. 1441-1451. ISSN 0093-9994

Lu, Liqing, Bryant, Angus T., Hudgins, Jerry L., Palmer, Patrick R. and Santi, Enrico. (2010) Physics-based model of planar-gate IGBT Including MOS side two-dimensional effects. IEEE Transactions on Industry Applications, Vol.46 (No.6). pp. 2556-2567. ISSN 0093-9994

Lu, Liqing, Chen, Zhiyang, Bryant, Angus T., Hudgins, Jerry L., Palmer, Patrick R. and Santi, Enrico. (2010) Modeling of MOS-Side carrier injection in trench-gate IGBTs. IEEE Transactions on Industry Applications, Vol.46 (No.2). pp. 875-883. ISSN 0093-9994

Du, Bin, Hudgins, Jerry L., Santi, Enrico, Bryant, Angus T., Palmer, Patrick R. and Mantooth, H. Alan, 1963- . (2010) Transient electrothermal simulation of power semiconductor devices. IEEE Transactions on Power Electronics, Vol.25 (No.1). pp. 237-248. ISSN 0885-8993

Du, Bin, Hudgins, Jerry L., Santi, Enrico, Bryant, Angus T., Palmer, Patrick R. and Mantooth, Homer Alan. (2010) Transient electrothermal simulation of power semiconductor devices. IEEE Transactions on Power Electronics, Vol.25 (No.1). pp. 237-248. ISSN 0885-8993

Yang, Shaoyong, Xiang, Dawei, Bryant, Angus T., Mawby, P. A. (Philip A.), Ran, Li and Tavner, Peter. (2010) Condition monitoring for device reliability in power electronic converters : a review. IEEE Transactions on Power Electronics, Vol.25 (No.11). pp. 2734-2752. ISSN 0885-8993

Leong, Kennith Kin, Bryant, Angus T. and Mawby, P. A. (Philip A.) (2010) Power MOSFET operation at cryogenic temperatures : comparison between HEXFET (R), MDMesh (TM) and CoolMOS (TM). In: 22nd International Symposium on Power Semiconductor Devices and ICs, Hiroshima, Japan, 06-10 Jun 2010 . Published in: Proceedings of the International Symposium on Power Semiconductor Devices & ICs pp. 209-212.

Yang, Shaoyong, Bryant, Angus T., Mawby, P. A. (Philip A.), Xiang, Dawei, Ran, Li and Tavner, Peter (2009) An industry-based survey of reliability in power electronic converters. In: IEEE Energy Conversion Congress and Exposition, San Jose, CA, SEP 20-24, 2009. Published in: 2009 IEEE Energy Conversion Congress and Exposition, Vols. 1-6 pp. 2612-2618.

Wang, Yalan, Palmer, Patrick R., Bryant, Angus T., Finney, Stephen J., Abu-Khaizaran, Muhammad S. and Li, Gangru (2009) An analysis of high-power IGBT switching under cascade active voltage control. In: 40th Annual Meeting of the IEEE Industry Applications Society, Hong Kong, People's Republic of China, October 02-06, 2005. Published in: IEEE Transactions on Industry Applications, Vol.45 (No.2). pp. 861-870.

Swan, I. R. (Ian R.), Bryant, A. T., Parker-Allotey, Nii-Adotei and Mawby, P. A. (Philip A.) (2009) 3-D thermal simulation of power module packaging. In: IEEE Energy Conversion Congress and Exposition, San Jose, CA, Sepbember 20-24, 2009. Published in: 2009 IEEE Energy Conversion Congress and Exposition, Vols. 1-6 pp. 1185-1192.

Bryant, Angus T., Jennings, M. R., Parker-Allotey, Nii-Adotei, Mawby, P. A. (Philip A.), Pérez-Tomás, Amador, Brosselard, P., Godignon, P., Jorda, X., Milian, J., Palmer, P. R., Santi, E. and Hudgins, J. L. (2009) Physical modelling of large area 4H-SiC PiN diodes. In: IEEE Energy Conversion Congress and Exposition, San Jose, CA, September 20-24, 2009. Published in: 2009 IEEE Energy Conversion Congress and Exposition, Vols. 1-6 pp. 494-501.

Bryant, Angus T., Mawby, P. A. (Philip A.), Palmer, Patrick R., Santi, Enrico and Hudgins, Jerry L. (2008) Exploration of power device reliability using compact device models and fast electrothermal simulation. In: 41st Annual Meeting of the IEEE Industry Applications Society, Tampa, FL, Oct 08-12, 2006. Published in: IEEE Transactions on Industry Applications, Vol.44 (No.3). pp. 894-903.

Bryant, Angus T., Lu, Liqing, Santi, E. (Enrico), Hudgins, Jerry L. and Palmer, Patrick R. (2008) Modeling of IGBT resistive and inductive turn-on behavior. In: IEEE Industry Applications Society 40th Annual Meeting, Kowloon, Hong Kong , Oct 02-06, 2005. Published in: IEEE Transactions on Industry Applications, Vol.44 (No.3). pp. 904-914.

Bryant, Angus T., Lu, Liqing, Santi, Enrico, Palmer, Patrick R. and Hudgins, Jerry L.. (2008) Physical modeling of fast p-i-n diodes with carrier lifetime zoning, part I : Device model. IEEE Transactions on Power Electronics, Vol.23 (No.1). pp. 189-197. ISSN 0885-8993

Lu, Liqing, Bryant, Angus T., Santi, E. (Enrico), Palmer, Patrick R. and Hudgins, Jerry L.. (2008) Physical modeling of fast p-i-n diodes with carrier lifetime zoning, part II : Parameter extraction. IEEE Transactions on Power Electronics, Vol.23 (No.1). pp. 198-205. ISSN 0885-8993

Swan, I. R. (Ian R.), Bryant, Angus T. and Mawby, P. A. (Philip A.) (2008) Fast thermal models for power device packaging. In: IEEE Industry-Applications-Society Annual Meeting, Alberta, Canada, Oct 05-09, 2008. Published in: Industry Applications Society. IEEE - IAS Annual Meeting. Conference Record, Vol.1-5 pp. 1457-1464.

Bryant, Angus T., Palmer, Patrick R., Santi, Enrico and Hudgins, Jerry L.. (2007) Simulation and optimization of diode and insulated gate bipolar transistor interaction in a chopper cell using MATLAB and Simulink. IEEE Transactions on Industry Applications, Vol.43 (No.4). pp. 874-883. ISSN 0093-9994

Bryant, Angus T., Parker-Allotey, Nii-Adotei and Palmer, Patrick R.. (2007) The use of condition maps in the design and testing of power electronic circuits and devices. IEEE Transactions on Industry Applications, Vol.43 (No.4). pp. 902-910. ISSN 0093-9994

Bryant, Angus T., Wang, Yalan, Finney, Stephen J., Lim, Tee Chong and Palmer, Patrick R.. (2007) Numerical optimization of an active voltage controller for high-power IGBT converters. IEEE Transactions on Power Electronics, Vol.22 (No.2). pp. 374-383. ISSN 0885-8993