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Number of items: 23.
2012
Swan, I. R. (Ian R.), Bryant, Angus T. and Mawby, P. A. (Philip A.) (2012) Fast 3D thermal simulation of power module packaging. International Journal of Numerical Modelling : Electronic Networks, Devices and Fields, Vol.25 (No.4). pp. 378-399. doi:10.1002/jnm.841 ISSN 0894-3370.
Donnellan, B. T., Roberts, G. J., Mawby, P. A. (Philip A.) and Bryant, Angus T. (2012) Modelling of current sharing in paralleled current limiting superjunction MOSFETs with common gate drives. Microelectronics Reliability, Vol.52 (No.3). pp. 497-502. doi:10.1016/j.microrel.2011.12.007 ISSN 0026-2714.
2011
Bryant, Angus T., Yang, Shaoyong, Mawby, P. A. (Philip A.), Xiang, Dawei, Ran, Li, Tavner, Peter and Palmer, Patrick R. (2011) Investigation into IGBT dV/dt during turn-off and its temperature dependence. IEEE Transactions on Power Electronics, Volume 26 (Number 10). pp. 3019-3031. doi:10.1109/TPEL.2011.2125803 ISSN 0885-8993.
Yang, Shaoyong, Bryant, Angus T., Mawby, P. A., Xiang, Dawei, Ran, Li and Tavner, Peter J. (2011) An industry-based survey of reliability in power electronic converters. IEEE Transactions on Industry Applications, Vol.47 (No.3). pp. 1441-1451. doi:10.1109/TIA.2011.2124436 ISSN 0093-9994.
2010
Lu, Liqing, Bryant, Angus T., Hudgins, Jerry L., Palmer, Patrick R. and Santi, Enrico (2010) Physics-based model of planar-gate IGBT Including MOS side two-dimensional effects. IEEE Transactions on Industry Applications, Vol.46 (No.6). pp. 2556-2567. doi:10.1109/TIA.2010.2071190 ISSN 0093-9994.
Lu, Liqing, Chen, Zhiyang, Bryant, Angus T., Hudgins, Jerry L., Palmer, Patrick R. and Santi, Enrico (2010) Modeling of MOS-Side carrier injection in trench-gate IGBTs. IEEE Transactions on Industry Applications, Vol.46 (No.2). pp. 875-883. doi:10.1109/TIA.2009.2039770 ISSN 0093-9994.
Du, Bin, Hudgins, Jerry L., Santi, Enrico, Bryant, Angus T., Palmer, Patrick R. and Mantooth, H. Alan (2010) Transient electrothermal simulation of power semiconductor devices. IEEE Transactions on Power Electronics, Vol.25 (No.1). pp. 237-248. doi:10.1109/TPEL.2009.2029105 ISSN 0885-8993.
Yang, Shaoyong, Xiang, Dawei, Bryant, Angus T., Mawby, P. A., Ran, Li and Tavner, Peter J. (2010) Condition monitoring for device reliability in power electronic converters : a review. IEEE Transactions on Power Electronics, Volume 25 (Number 11). pp. 2734-2752. doi:10.1109/TPEL.2010.2049377 ISSN 0885-8993.
Leong, K. K., Bryant, Angus T. and Mawby, P. A. (Philip A.) (2010) Power MOSFET operation at cryogenic temperatures : comparison between HEXFET (R), MDMesh (TM) and CoolMOS (TM). In: 22nd International Symposium on Power Semiconductor Devices and ICs, Hiroshima, Japan, 06-10 Jun 2010 . Published in: Proceedings of the International Symposium on Power Semiconductor Devices & ICs pp. 209-212. ISSN 1943-653X.
2009
Wang, Yalan, Palmer, Patrick R., Bryant, Angus T., Finney, Stephen J., Abu-Khaizaran, Muhammad S. and Li, Gangru (2009) An analysis of high-power IGBT switching under cascade active voltage control. In: 40th Annual Meeting of the IEEE Industry Applications Society, Hong Kong, People's Republic of China, October 02-06, 2005. Published in: IEEE Transactions on Industry Applications, Vol.45 (No.2). pp. 861-870. doi:10.1109/TIA.2009.2013595 ISSN 0093-9994.
Swan, I. R. (Ian R.), Bryant, A. T., Parker-Allotey, Nii-Adotei and Mawby, P. A. (Philip A.) (2009) 3-D thermal simulation of power module packaging. In: IEEE Energy Conversion Congress and Exposition, San Jose, CA, Sepbember 20-24, 2009. Published in: 2009 IEEE Energy Conversion Congress and Exposition, Vols. 1-6 pp. 1185-1192. ISBN 978-1-4244-2892-2. doi:10.1109/ECCE.2009.5316235
Bryant, Angus T., Jennings, M. R., Parker-Allotey, Nii-Adotei, Mawby, P. A. (Philip A.), PΓ©rez-TomΓ‘s, Amador, Brosselard, P., Godignon, P., Jorda, X., Milian, J., Palmer, P. R., Santi, E. and Hudgins, J. L. (2009) Physical modelling of large area 4H-SiC PiN diodes. In: IEEE Energy Conversion Congress and Exposition, San Jose, CA, September 20-24, 2009. Published in: 2009 IEEE Energy Conversion Congress and Exposition, Vols. 1-6 pp. 494-501. ISBN 978-1-4244-2892-2. doi:10.1109/ECCE.2009.5316233
Yang, Shaoyong, Bryant, Angus T., Mawby, P. A. (Philip A.), Xiang, Dawei, Ran, Li and Tavner, Peter (2009) An industry-based survey of reliability in power electronic converters. In: IEEE Energy Conversion Congress and Exposition, San Jose, CA, 20-24 Sep 2009. Published in: 2009 IEEE Energy Conversion Congress and Exposition, Vols. 1-6, Volume 1-6 pp. 2612-2618. ISBN 9781424428922. doi:10.1109/ECCE.2009.5316356
2008
Bryant, Angus T., Mawby, P. A. (Philip A.), Palmer, Patrick R., Santi, Enrico and Hudgins, Jerry L. (2008) Exploration of power device reliability using compact device models and fast electrothermal simulation. In: 41st Annual Meeting of the IEEE Industry Applications Society, Tampa, FL, Oct 08-12, 2006. Published in: IEEE Transactions on Industry Applications, Vol.44 (No.3). pp. 894-903. doi:10.1109/TIA.2008.921388 ISSN 0093-9994.
Bryant, Angus T., Lu, Liqing, Santi, E. (Enrico), Hudgins, Jerry L. and Palmer, Patrick R. (2008) Modeling of IGBT resistive and inductive turn-on behavior. In: IEEE Industry Applications Society 40th Annual Meeting, Kowloon, Hong Kong , Oct 02-06, 2005. Published in: IEEE Transactions on Industry Applications, Vol.44 (No.3). pp. 904-914. doi:10.1109/TIA.2008.921384 ISSN 0093-9994.
Bryant, Angus T., Lu, Liqing, Santi, Enrico, Palmer, Patrick R. and Hudgins, Jerry L. (2008) Physical modeling of fast p-i-n diodes with carrier lifetime zoning, part I : Device model. IEEE Transactions on Power Electronics, Vol.23 (No.1). pp. 189-197. doi:10.1109/TPEL.2007.911823 ISSN 0885-8993.
Lu, Liqing, Bryant, Angus T., Santi, E. (Enrico), Palmer, Patrick R. and Hudgins, Jerry L. (2008) Physical modeling of fast p-i-n diodes with carrier lifetime zoning, part II : Parameter extraction. IEEE Transactions on Power Electronics, Vol.23 (No.1). pp. 198-205. doi:10.1109/TPEL.2007.911825 ISSN 0885-8993.
Swan, I. R. (Ian R.), Bryant, Angus T. and Mawby, P. A. (Philip A.) (2008) Fast thermal models for power device packaging. In: IEEE Industry-Applications-Society Annual Meeting, Alberta, Canada, Oct 05-09, 2008. Published in: Industry Applications Society. IEEE - IAS Annual Meeting. Conference Record, Vol.1-5 pp. 1457-1464. ISBN 978-1-4244-2278-4. doi:10.1109/08IAS.2008.359 ISSN 0197-2618.
2007
Bryant, Angus T., Palmer, Patrick R., Santi, Enrico and Hudgins, Jerry L. (2007) Simulation and optimization of diode and insulated gate bipolar transistor interaction in a chopper cell using MATLAB and Simulink. IEEE Transactions on Industry Applications, Vol.43 (No.4). pp. 874-883. doi:10.1109/TIA.2007.900443 ISSN 0093-9994.
Bryant, Angus T., Parker-Allotey, Nii-Adotei and Palmer, Patrick R. (2007) The use of condition maps in the design and testing of power electronic circuits and devices. IEEE Transactions on Industry Applications, Vol.43 (No.4). pp. 902-910. doi:10.1109/TIA.2007.900470 ISSN 0093-9994.
Bryant, Angus T., Wang, Yalan, Finney, Stephen J., Lim, Tee Chong and Palmer, Patrick R. (2007) Numerical optimization of an active voltage controller for high-power IGBT converters. IEEE Transactions on Power Electronics, Vol.22 (No.2). pp. 374-383. doi:10.1109/TPEL.2006.889895 ISSN 0885-8993.
Bryant, A. T., Roberts, G. J., Walker, A. and Mawby, P. A. (Philip A.) (2007) Fast inverter loss simulation and silicon carbide device evaluation for hybrid electric vehicle drives. In: 4th Power Conversion Conference (PCC-Nagoya 2007), Nagoya, Japan, 2-5 Apr 2007. Published in: 2007 Power Conversion Conference - Nagoya, Vols 1-3 pp. 1017-1024. ISBN 9781424408436.
McGordon, Andrew, Bryant, Angus T., Jennings, P. A. (Paul A.) and Mawby, P. A. (Philip A.) (2007) Inverter temperature rise predictions in a heavy duty vehicle for a range of hybrid electric vehicle architectures. In: 23rd International Electric Vehicle Symposium and Exposition, Anaheim, California, 02-05 Dec 2007. Published in: Proceedings of the 23rd International Battery, Hybrid and Fuel Cell Electric Vehicle Symposium EVS-23 ISBN 9781605607931.
This list was generated on Thu Mar 28 19:30:52 2024 GMT.