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Items where Department is "Faculty of Science, Engineering and Medicine > Science > Physics"
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Number of items: 5.
Hu, Z. W., Thomas, Pam A., Gupta, Mool C. and Risk, William Paul (1995) Multiple-crystal X-ray topographic characterization of periodically domain-inverted KTiOPO4 crystal. Applied Physics Letters, Vol.66 (No.1). pp. 13-15. doi:10.1063/1.114165 ISSN 0003-6951.
King, P. J. C., Breese, Mark B. H., Smulders, P. J. M., Wilkinson, A. J., Booker, G. R., Parker, Evan H. C. and Grime, G. W. (1995) Evidence from ion channeling images for the elastic relaxation of a Si0.85Ge0.15 layer grown on a patterned Si substrate. Applied Physics Letters, Vol.67 (No.24). pp. 3566-3568. doi:10.1063/1.115319 ISSN 0003-6951.
Rowlands, G. (George) (1995) Measurement of penetration depths in superconducting films. Applied Physics Letters, Vol.66 (No.24). p. 3355. doi:10.1063/1.113755 ISSN 0003-6951.
Sugden, S., Sofield, C. J., Noakes, T. C. Q., Kubiak, Richard A. A. and McConville, C. F. (Chris F.) (1995) Probing the interfacial and sub-surface structure of Si/Si1 – xGex multilayers. Applied Physics Letters, Vol.66 (No.21). pp. 2849-2851. doi:10.1063/1.113450 ISSN 0003-6951.
Whall, Terry E., Plews, Andrew D., Mattey, Nevil L., Phillips, P. J. (Peter J.) and Ekenberg, U. (1995) Effective mass and band nonparabolicity in remote doped Si/Si0.8Ge0.2 quantum wells. Applied Physics Letters, Vol.66 (No.20). pp. 2724-2726. doi:10.1063/1.113501 ISSN 0003-6951.