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Items where Department is "Faculty of Science, Engineering and Medicine > Science > Physics"
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Number of items: 5.
Journal Article
Hu, Z. W., Thomas, Pam A., Gupta, Mool C. and Risk, William Paul (1995) Multiple-crystal X-ray topographic characterization of periodically domain-inverted KTiOPO4 crystal. Applied Physics Letters, Vol.66 (No.1). pp. 13-15. doi:10.1063/1.114165
King, P. J. C., Breese, Mark B. H., Smulders, P. J. M., Wilkinson, A. J., Booker, G. R., Parker, Evan H. C. and Grime, G. W. (1995) Evidence from ion channeling images for the elastic relaxation of a Si0.85Ge0.15 layer grown on a patterned Si substrate. Applied Physics Letters, Vol.67 (No.24). pp. 3566-3568. doi:10.1063/1.115319
Rowlands, G. (George) (1995) Measurement of penetration depths in superconducting films. Applied Physics Letters, Vol.66 (No.24). p. 3355. doi:10.1063/1.113755
Sugden, S., Sofield, C. J., Noakes, T. C. Q., Kubiak, Richard A. A. and McConville, C. F. (Chris F.) (1995) Probing the interfacial and sub-surface structure of Si/Si1 – xGex multilayers. Applied Physics Letters, Vol.66 (No.21). pp. 2849-2851. doi:10.1063/1.113450
Whall, Terry E., Plews, Andrew D., Mattey, Nevil L., Phillips, P. J. (Peter J.) and Ekenberg, U. (1995) Effective mass and band nonparabolicity in remote doped Si/Si0.8Ge0.2 quantum wells. Applied Physics Letters, Vol.66 (No.20). pp. 2724-2726. doi:10.1063/1.113501