
The Library
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Number of items: 3.
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Grant, Nicholas E., Markevich, Vladimir, Mullins, Jack, Peaker, Anthony R., Rougieux, Fiacre E., Macdonald, Daniel and Murphy, John D. (2016) Permanent annihilation of thermally activated defects which limit the lifetime of float-zone silicon. Physica Status Solidi A, 213 (11). pp. 2844-2849. doi:10.1002/pssa.201600360 ISSN 1862-6300.
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Liu, A. Y., Sun, C., Markevic, V. P., Peaker, A. R., Murphy, John D. and Macdonald, D. (2016) Gettering of interstitial iron in silicon by plasma enhanced chemical vapour deposited silicon nitride films. Journal of Applied Physics, 120 (19). 193103. doi:10.1063/1.4967914 ISSN 0021-8979.
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Rougieux, Fiacre E., Grant, Nicholas E., Barugkin, Chug, Macdonald, Daniel and Murphy, John D. (2015) Influence of annealing and bulk hydrogenation on lifetime-limiting defects in nitrogen-doped floating zone silicon. IEEE Journal of Photovoltaics, 5 (2). pp. 495-498. doi:10.1109/JPHOTOV.2014.2367912