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Morris, R. J. H. (Richard J. H.) and Dowsett, M. G. (2009) Ion yields and erosion rates for Si1−xGex(0x1) ultralow energy O2+ secondary ion mass spectrometry in the energy range of 0.25–1 keV. Journal of Applied Physics, Vol.105 (No.11). p. 4316. doi:10.1063/1.3139279 ISSN 0021-8979.