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Belykh, S. F., Palitsin, V. V., Veryovkin, I. V., Kovarsky, A. P., Chang, R. J. H., Adriaens, A. (Annemie), Dowsett, M. G. and Adams, F. (2007) New Cs sputter ion source with polyatomic ion beams for secondary ion mass spectrometry applications. Review of Scientific Instruments, Vol.78 (No.8). Article: 085101. doi:10.1063/1.2761021 ISSN 0034-6748.
