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Multiple-crystal X-ray topographic characterization of periodically domain-inverted KTiOPO4 crystal
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Hu, Z. W., Thomas, Pam A., Gupta, Mool C. and Risk, William Paul (1995) Multiple-crystal X-ray topographic characterization of periodically domain-inverted KTiOPO4 crystal. Applied Physics Letters, Vol.66 (No.1). pp. 13-15. doi:10.1063/1.114165 ISSN 0003-6951.
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Official URL: http://dx.doi.org/10.1063/1.114165
Abstract
A periodically domain-inverted KTiOPO4 crystal has been characterized for the first time by multiple-crystal multiple-reflection x-ray topography. The striation contrast within the domain- inverted regions has been revealed in high strain-sensitivity reflection topographs. The origin of formation of the striation contrast and the mechanism of domain inversion in KTiOPO4 are discussed in terms of the structural characteristics of KTiOPO4.
Item Type: | Journal Article | ||||
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Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering Q Science > QC Physics |
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Divisions: | Faculty of Science, Engineering and Medicine > Science > Physics | ||||
Library of Congress Subject Headings (LCSH): | Potassium compounds, Titanates, Phosphates, X-rays -- Diffraction, Heterostructures | ||||
Journal or Publication Title: | Applied Physics Letters | ||||
Publisher: | American Institute of Physics | ||||
ISSN: | 0003-6951 | ||||
Official Date: | 2 January 1995 | ||||
Dates: |
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Volume: | Vol.66 | ||||
Number: | No.1 | ||||
Page Range: | pp. 13-15 | ||||
DOI: | 10.1063/1.114165 | ||||
Status: | Peer Reviewed | ||||
Access rights to Published version: | Open Access (Creative Commons) | ||||
Funder: | Science and Engineering Research Council (Great Britain) (SERC) | ||||
Grant number: | GR/T 02414 (SERC) |
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