Al-Amin, Mohammad, Grant, Nicholas E., Pointon, A. I. and Murphy, J. D. (2019) Data for Iodine-ethanol surface passivation for measurement of millisecond carrier lifetimes in silicon wafers with different crystallographic orientations. [Dataset]

	Plain Text (Readme file) 2019-06-14 readme text for WRAP.txt - Published Version Available under License Creative Commons Attribution 4.0. Download (598b)
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Abstract

To improve silicon device fabrication processes it is necessary to monitor bulk minority carrier lifetimes accurately, and this requires surface recombination to be well controlled and, ideally, minimized. Good surface passivation can result from thermal oxidation or by deposition of dielectrics (e.g. Al2O3, SiNx, amorphous Si), but these forms of passivation can modify the lifetime of the material under investigation. Various schemes can passivate surfaces on a temporary basis without modifying the bulk, and, in this paper, the virtues of the iodine‐ethanol temporary surface passivation scheme are explored. A procedure for preparing the wafer surfaces prior to passivation is developed. For the optimised pre‐treatment, a series of experiments on 3–5 Ωcm float‐zone wafers cut from the same ingot with different thicknesses is conducted. This enables the material's bulk lifetime to be measured at 1015 cm−3 injection as ≈46 ms, with the surface recombination velocity being 6.5 ± 0.3 cm s−1. Iodine‐ethanol passivation is then compared to a recently developed superacid‐derived temporary passivation scheme. Although the latter is superior on (100)‐orientation substrates, iodine‐ethanol performs much better on (111)‐orientation substrates, making it a better choice for (111)‐orientation wafers, such as those used for power devices.

Item Type:	Dataset
Subjects:	Q Science > QD Chemistry T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions:	Faculty of Science, Engineering and Medicine > Engineering > Engineering
Type of Data:	Experimental data
Library of Congress Subject Headings (LCSH):	Silicon -- Research, Passivity (Chemistry), Surface chemistry, Electrochemical analysis, Superacids, Iodine, Ethanol
Journal or Publication Title:	Physica Status Solidi A
Publisher:	University of Warwick, School of Engineering
ISSN:	1862-6300
Official Date:	26 June 2019
Dates:	Date Event 26 June 2019 Published 14 June 2019 Submitted
Status:	Not Peer Reviewed
Publication Status:	Published
Media of Output (format):	.xlsx
Access rights to Published version:	Open Access (Creative Commons)
Copyright Holders:	University of Warwick
Description:	The dataset (a single file in XLSX format) contains the data behind the figures in the paper. Captions to the figures are given in the paper. Abbreviations, variables and methods used are defined in the paper.
Date of first compliant deposit:	18 June 2019
Date of first compliant Open Access:	26 June 2019
RIOXX Funder/Project Grant:	Project/Grant ID RIOXX Funder Name Funder ID EP/M024911/1 [EPSRC] Engineering and Physical Sciences Research Council http://dx.doi.org/10.13039/501100000266 EP/R511808/1 [EPSRC] Engineering and Physical Sciences Research Council http://dx.doi.org/10.13039/501100000266 EP/J01768X/2 [EPSRC] Engineering and Physical Sciences Research Council http://dx.doi.org/10.13039/501100000266 EP/N509796/1 [EPSRC] Engineering and Physical Sciences Research Council http://dx.doi.org/10.13039/501100000266
Related URLs:	Publisher Other Related item in WRAP

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