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Neural network based electronic nose for apple ripeness determination
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UNSPECIFIED (1999) Neural network based electronic nose for apple ripeness determination. ELECTRONICS LETTERS, 35 (10). pp. 821-823. ISSN 0013-5194.
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Abstract
It is possible to non-destructively determine apple ripeness using a simple electronic nose. The instrument employs tin oxide resistive gas sensors and neural networks (fuzzy ARTMAP, LVQ and MLP) to classify the samples into three states df ripeness with 100% accuracy. Fuzzy ARTMAP was found to be the best classifier in the presence of simulated Gaussian noise.
Item Type: | Journal Article | ||||
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Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering | ||||
Journal or Publication Title: | ELECTRONICS LETTERS | ||||
Publisher: | IEE-INST ELEC ENG | ||||
ISSN: | 0013-5194 | ||||
Official Date: | 13 May 1999 | ||||
Dates: |
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Volume: | 35 | ||||
Number: | 10 | ||||
Number of Pages: | 3 | ||||
Page Range: | pp. 821-823 | ||||
Publication Status: | Published |
Data sourced from Thomson Reuters' Web of Knowledge
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