The Library
Integrated silicon photonics OFDR system for high-resolution distributed measurements based on Rayleigh backscattering
Tools
Han, Gaoce, Guo, Zhen, Wang, Shumeng, Du, Han, Marco, James, Greenwood, David, Yu, Yifei and Yan, Jize (2024) Integrated silicon photonics OFDR system for high-resolution distributed measurements based on Rayleigh backscattering. Journal of Lightwave Technology, 42 (9). pp. 3482-3493. doi:10.1109/jlt.2024.3350079 ISSN 0733-8724.
Research output not available from this repository.
Request-a-Copy directly from author or use local Library Get it For Me service.
Official URL: https://doi.org/10.1109/jlt.2024.3350079
Abstract
Optical frequency domain reflectometry (OFDR) has high spatial resolution and measurement accuracy, driving its popularity in various fields. Integration of OFDR technology has made it accessible, cost-effective and deployable in many applications, including battery management and photonic integrated circuits. An integrated OFDR system based on Rayleigh backscattering and silicon photonics technology on an SOI platform has been developed for the first time. The system's simplified configuration was simulated, fabricated and characterized in detail, achieving an experimental spatial resolution of 8.28 μm, matching the theoretical level. This system shows high potential for sensing, monitoring and detection where precise spatial information is crucial. OFDR's accessibility and high performance in distributed measurements make it a promising technology for future advancements.
Item Type: | Journal Article | ||||||||
---|---|---|---|---|---|---|---|---|---|
Divisions: | Faculty of Science, Engineering and Medicine > Engineering > WMG (Formerly the Warwick Manufacturing Group) | ||||||||
SWORD Depositor: | Library Publications Router | ||||||||
Journal or Publication Title: | Journal of Lightwave Technology | ||||||||
Publisher: | IEEE | ||||||||
ISSN: | 0733-8724 | ||||||||
Official Date: | 1 May 2024 | ||||||||
Dates: |
|
||||||||
Volume: | 42 | ||||||||
Number: | 9 | ||||||||
Page Range: | pp. 3482-3493 | ||||||||
DOI: | 10.1109/jlt.2024.3350079 | ||||||||
Status: | Peer Reviewed | ||||||||
Publication Status: | Published | ||||||||
Access rights to Published version: | Restricted or Subscription Access |
Request changes or add full text files to a record
Repository staff actions (login required)
View Item |