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A method for the accurate comparison of lattice parameters
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UNSPECIFIED (1995) A method for the accurate comparison of lattice parameters. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 28 (Part 6). pp. 753-760. ISSN 0021-8898.
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Abstract
A new method of comparison of lattice parameters is described. The method uses a standard double-crystal diffractometer, fitted with a specimen rotation stage, which compensates for tilt errors on the specimen setting. Some improvement is possible through the use of a monochromatizing system with a well defined wavelength. The use of a single reference standard enables the instrument zero to be accurately determined; the use of a second reference or a different reflection from the first allows the wavelength to be accurately determined. The errors are carefully assessed and it is shown that some errors important in other methods are self-cancelling through the use of the rotation stage, which need not itself be an ultraprecision component. Peak location to a confidence level of 10 '' permits absolute traceable lattice-parameter determination to a few tens of parts in 10(6), with much greater relative sensitivity. The method is verified using both a tangent-arm-driven and direct-drive double-axis diffractometer at room temperature on samples of semi-insulating gallium arsenide. Comparison of the lattice parameter of a sample using this method and the conventional Bond technique is satisfactory.
Item Type: | Journal Article | ||||
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Subjects: | Q Science > QD Chemistry | ||||
Journal or Publication Title: | JOURNAL OF APPLIED CRYSTALLOGRAPHY | ||||
Publisher: | MUNKSGAARD INT PUBL LTD | ||||
ISSN: | 0021-8898 | ||||
Official Date: | 1 December 1995 | ||||
Dates: |
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Volume: | 28 | ||||
Number: | Part 6 | ||||
Number of Pages: | 8 | ||||
Page Range: | pp. 753-760 | ||||
Publication Status: | Published |
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