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INVERSE-PHOTOEMISSION AND AUGER-ELECTRON SPECTROSCOPY OF RH THIN-FILMS ON CU(100)
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UNSPECIFIED (1995) INVERSE-PHOTOEMISSION AND AUGER-ELECTRON SPECTROSCOPY OF RH THIN-FILMS ON CU(100). JOURNAL OF PHYSICS-CONDENSED MATTER, 7 (49). pp. 9475-9484. ISSN 0953-8984.
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Abstract
The growth of Rh films on Cu(100) has been investigated using Auger electron spectroscopy and momentum- (k-) resolved inverse photoemission (KRIPES) with a view to probing the electronic structure of near-monolayer films and any possible magnetic ordering within these films. A pronounced change in the line-shape of the Rh M(4,5)VV Anger electron peak as a function of average layer thickness indicates significant d-band narrowing in the films of monolayer or submonolayer thickness relative to thicker films. KRIPES data indicate that in films grown at room temperature the spectra are dominated by density-of-states effects implying poor order, and showing the expected unoccupied d-band feature at the Fermi level. Annealing at 750-900 K leads to significant loss of Rh into the substrate, and KRIPES spectra dominated by surface-localized states showing significant dispersion in parallel momentum more characteristic of s-p-band features.
Item Type: | Journal Article | ||||
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Subjects: | Q Science > QC Physics | ||||
Journal or Publication Title: | JOURNAL OF PHYSICS-CONDENSED MATTER | ||||
Publisher: | IOP PUBLISHING LTD | ||||
ISSN: | 0953-8984 | ||||
Official Date: | 4 December 1995 | ||||
Dates: |
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Volume: | 7 | ||||
Number: | 49 | ||||
Number of Pages: | 10 | ||||
Page Range: | pp. 9475-9484 | ||||
Publication Status: | Published |
Data sourced from Thomson Reuters' Web of Knowledge
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