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INELASTIC ELECTRON-TUNNELING SPECTROSCOPY AND XPS STUDY OF THE OXIDES GROWN ON 3 ALUMINUM-ALLOYS
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UNSPECIFIED (1995) INELASTIC ELECTRON-TUNNELING SPECTROSCOPY AND XPS STUDY OF THE OXIDES GROWN ON 3 ALUMINUM-ALLOYS. SURFACE AND INTERFACE ANALYSIS, 23 (10). pp. 705-711. ISSN 0142-2421.
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Abstract
Three aluminium alloys, each with different major alloying components, have been studied using inelastic electron tunnelling spectroscopy (IETS) and XPS. The oxides grown on alloys containing magnesium and copper have IET spectra similar to that grown on pure aluminium and their IET spectra when doped with benzoic acid also show no differences. The alloy containing silicon gives a very different IET spectrum that has band positions similar to aluminosilicates. When doped with benzoic acid the IET spectrum of this latter alloy also shows major differences to that of benzoic acid on pure aluminium (oxide), both in band intensities and particularly in the carboxylate stretching modes. X-ray photoelectron spectroscopy analysis of the oxides on both the alloy thin films (IETS) and metal tokens confirms the results suggested by the IET spectra, showing that the magnesium and copper do not appear in the oxides of the first two alloys but that silicon is present in the oxide of the third and in quantities greater than that of the alloy composition.
Item Type: | Journal Article | ||||
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Subjects: | Q Science > QD Chemistry | ||||
Journal or Publication Title: | SURFACE AND INTERFACE ANALYSIS | ||||
Publisher: | JOHN WILEY & SONS LTD | ||||
ISSN: | 0142-2421 | ||||
Official Date: | September 1995 | ||||
Dates: |
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Volume: | 23 | ||||
Number: | 10 | ||||
Number of Pages: | 7 | ||||
Page Range: | pp. 705-711 | ||||
Publication Status: | Published |
Data sourced from Thomson Reuters' Web of Knowledge
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