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Using statistics to reduce the uncertainty in system level susceptibility testing
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UNSPECIFIED (1995) Using statistics to reduce the uncertainty in system level susceptibility testing. In: IEEE 1995 International Symposium on Electromagnetic Compatibility - EMC: A Global Concern, ATLANTA, GA, AUG 14-18, 1995. Published in: EMC - A GLOBAL CONCERN : IEEE 1995 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SYMPOSIUM RECORD pp. 47-50. ISBN 0-7803-2574-5.
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Item Type: | Conference Item (UNSPECIFIED) | ||||
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Subjects: | R Medicine T Technology > TK Electrical engineering. Electronics Nuclear engineering G Geography. Anthropology. Recreation |
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Journal or Publication Title: | EMC - A GLOBAL CONCERN : IEEE 1995 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SYMPOSIUM RECORD | ||||
Publisher: | I E E E | ||||
ISBN: | 0-7803-2574-5 | ||||
Official Date: | 1995 | ||||
Dates: |
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Number of Pages: | 4 | ||||
Page Range: | pp. 47-50 | ||||
Publication Status: | Published | ||||
Title of Event: | IEEE 1995 International Symposium on Electromagnetic Compatibility - EMC: A Global Concern | ||||
Location of Event: | ATLANTA, GA | ||||
Date(s) of Event: | AUG 14-18, 1995 |
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