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Fast x-ray scatter ratio method for security screening applications
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UNSPECIFIED (1995) Fast x-ray scatter ratio method for security screening applications. In: Conference on Law Enforcement Technologies - Identification Technologies and Traffic Safety, MUNICH, GERMANY, JUN 21-22, 1995. Published in: LAW ENFORCEMENT TECHNOLOGIES: IDENTIFICATION TECHNOLOGIES AND TRAFFIC SAFETY, 2511 pp. 79-85. ISBN 0-8194-1869-2.
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Item Type: | Conference Item (UNSPECIFIED) | ||||
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Subjects: | Q Science > QC Physics | ||||
Series Name: | PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE) | ||||
Journal or Publication Title: | LAW ENFORCEMENT TECHNOLOGIES: IDENTIFICATION TECHNOLOGIES AND TRAFFIC SAFETY | ||||
Publisher: | SPIE - INT SOC OPTICAL ENGINEERING | ||||
ISBN: | 0-8194-1869-2 | ||||
Editor: | Dubuisson, B and Harding, G | ||||
Official Date: | 1995 | ||||
Dates: |
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Volume: | 2511 | ||||
Number of Pages: | 7 | ||||
Page Range: | pp. 79-85 | ||||
Publication Status: | Published | ||||
Title of Event: | Conference on Law Enforcement Technologies - Identification Technologies and Traffic Safety | ||||
Location of Event: | MUNICH, GERMANY | ||||
Date(s) of Event: | JUN 21-22, 1995 |
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