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A NOVEL BEAM-CONDITIONING MONOCHROMATOR FOR HIGH-RESOLUTION X-RAY-DIFFRACTION
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UNSPECIFIED (1995) A NOVEL BEAM-CONDITIONING MONOCHROMATOR FOR HIGH-RESOLUTION X-RAY-DIFFRACTION. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 28 (Part 3). pp. 314-317. ISSN 0021-8898.
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Abstract
This paper describes a novel duMond-configuration monochromator for high-resolution X-ray diffraction. The device consists of two single-crystal blocks of silicon each containing two beam channels cut respectively parallel to and 17.65 degrees from the (011) planes. In the high-intensity mode, with Cu K alpha(1) radiation, the beam divergence is 11.5 '' and the dispersion is 1.3 x 10(-4) with intensity comparable with that from a symmetric Ge 022 device. The high-resolution setting has a divergence of 4.4 '' and dispersion of 4.9 x 10(-5), the intensity being a factor of ten lower than in the high-intensity setting. Parallel lateral translation of the two elements permits a rapid switch between the high-resolution and high-intensity settings.
Item Type: | Journal Article | ||||
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Subjects: | Q Science > QD Chemistry | ||||
Journal or Publication Title: | JOURNAL OF APPLIED CRYSTALLOGRAPHY | ||||
Publisher: | WILEY-BLACKWELL PUBLISHING, INC | ||||
ISSN: | 0021-8898 | ||||
Official Date: | 1 June 1995 | ||||
Dates: |
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Volume: | 28 | ||||
Number: | Part 3 | ||||
Number of Pages: | 4 | ||||
Page Range: | pp. 314-317 | ||||
Publication Status: | Published |
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