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PROBING THE INTERFACIAL AND SUBSURFACE STRUCTURE OF SI/SI1-XGEX MULTILAYERS
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UNSPECIFIED (1995) PROBING THE INTERFACIAL AND SUBSURFACE STRUCTURE OF SI/SI1-XGEX MULTILAYERS. APPLIED PHYSICS LETTERS, 66 (21). pp. 2849-2851. ISSN 0003-6951.
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Item Type: | Journal Article | ||||
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Subjects: | Q Science > QC Physics | ||||
Journal or Publication Title: | APPLIED PHYSICS LETTERS | ||||
Publisher: | AMER INST PHYSICS | ||||
ISSN: | 0003-6951 | ||||
Official Date: | 22 May 1995 | ||||
Dates: |
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Volume: | 66 | ||||
Number: | 21 | ||||
Number of Pages: | 3 | ||||
Page Range: | pp. 2849-2851 | ||||
Publication Status: | Published |
Data sourced from Thomson Reuters' Web of Knowledge
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