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PHOTOELECTRON DIFFRACTION FOR QUANTITATIVE-DETERMINATION OF ADSORPTION STRUCTURES ON SURFACES
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UNSPECIFIED (1995) PHOTOELECTRON DIFFRACTION FOR QUANTITATIVE-DETERMINATION OF ADSORPTION STRUCTURES ON SURFACES. In: 8th International Conference on X-Ray Absorption Fine Structure (XAFS VIII), FREIE UNIV BERLIN, BERLIN, GERMANY, AUG 28-SEP 01, 1994. Published in: PHYSICA B-CONDENSED MATTER, 209 (1-4). pp. 423-426. ISSN 0921-4526.
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Abstract
The technique of scanned-energy mode photoelectron diffraction for the quantitative determination of surface structures is described and compared in physical approach, methodology, and potential, with that of SEXAFS. The development of both direct methods of data analysis for first-order structure determination, and full multiple scattering simulations, is described, as is one of the first applications of chemical shift photoelectron diffraction for the study of complex coadsorption structures.
Item Type: | Conference Item (UNSPECIFIED) | ||||
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Subjects: | Q Science > QC Physics | ||||
Journal or Publication Title: | PHYSICA B-CONDENSED MATTER | ||||
Publisher: | ELSEVIER SCIENCE BV | ||||
ISSN: | 0921-4526 | ||||
Official Date: | March 1995 | ||||
Dates: |
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Volume: | 209 | ||||
Number: | 1-4 | ||||
Number of Pages: | 4 | ||||
Page Range: | pp. 423-426 | ||||
Publication Status: | Published | ||||
Title of Event: | 8th International Conference on X-Ray Absorption Fine Structure (XAFS VIII) | ||||
Location of Event: | FREIE UNIV BERLIN, BERLIN, GERMANY | ||||
Date(s) of Event: | AUG 28-SEP 01, 1994 |
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