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POTENTIAL APPLICATIONS OF A NOVEL X-RAY SOURCE IN MATERIAL CHARACTERIZATION
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UNSPECIFIED (1994) POTENTIAL APPLICATIONS OF A NOVEL X-RAY SOURCE IN MATERIAL CHARACTERIZATION. In: Conference on Substance Detection Systems, INNSBRUCK, AUSTRIA, OCT 05-08, 1993. Published in: SUBSTANCE DETECTION SYSTEMS, 2092 pp. 411-416. ISBN 0-8194-1365-8.
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Item Type: | Conference Item (UNSPECIFIED) | ||||
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Subjects: | Q Science > QC Physics | ||||
Series Name: | PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE) | ||||
Journal or Publication Title: | SUBSTANCE DETECTION SYSTEMS | ||||
Publisher: | SPIE - INT SOC OPTICAL ENGINEERING | ||||
ISBN: | 0-8194-1365-8 | ||||
Editor: | Harding, G and Lanza, RC and Myers, LJ and Young, PA | ||||
Official Date: | 1994 | ||||
Dates: |
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Volume: | 2092 | ||||
Number of Pages: | 6 | ||||
Page Range: | pp. 411-416 | ||||
Publication Status: | Published | ||||
Title of Event: | Conference on Substance Detection Systems | ||||
Location of Event: | INNSBRUCK, AUSTRIA | ||||
Date(s) of Event: | OCT 05-08, 1993 |
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