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Modification of charge transport in triphenyldiamine films induced by acid oxidized single-walled carbon nanotube interlayers
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Tan, Li Wei, Hatton, Ross A., Latini, Gianluca, Shannon, John M. and Silva, S. R. P. (2008) Modification of charge transport in triphenyldiamine films induced by acid oxidized single-walled carbon nanotube interlayers. Nanotechnology, Vol.19 (No.48). doi:10.1088/0957-4484/19/48/485706 ISSN 0957-4484.
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Official URL: http://dx.doi.org/10.1088/0957-4484/19/48/485706
Abstract
We report the modification of the transport, optical and electrical properties of 200 nm thick N, N'-diphenyl-N, N'-bis(3-methylphenyl)- 1,1'biphenyl-4,4' diamine (TPD) films on indium-tin oxide (ITO) when a low density of acid oxidized single-walled carbon nanotubes (o-SWCNTs) are present at the ITO/TPD interface. Most significantly, current - voltage measurements show strong evidence for a change from contact to bulk limited transport. We postulate that these observations result from a change in the structure of the TPD film seeded by the presence of o-SWCNTs at the ITO surface.
Item Type: | Journal Article | ||||
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Subjects: | Q Science > QC Physics T Technology > TA Engineering (General). Civil engineering (General) T Technology > TK Electrical engineering. Electronics Nuclear engineering |
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Divisions: | Faculty of Science, Engineering and Medicine > Science > Chemistry | ||||
Library of Congress Subject Headings (LCSH): | Charge transfer, Nanotubes, Light emitting diodes, Semiconductors | ||||
Journal or Publication Title: | Nanotechnology | ||||
Publisher: | Institute of Physics Publishing Ltd. | ||||
ISSN: | 0957-4484 | ||||
Official Date: | 3 December 2008 | ||||
Dates: |
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Volume: | Vol.19 | ||||
Number: | No.48 | ||||
Number of Pages: | 4 | ||||
DOI: | 10.1088/0957-4484/19/48/485706 | ||||
Status: | Peer Reviewed | ||||
Publication Status: | Published | ||||
Access rights to Published version: | Restricted or Subscription Access | ||||
Funder: | Carbon Trust, Engineering and Physical Sciences Research Council (EPSRC), Royal Academy of Engineering (Great Britain) |
Data sourced from Thomson Reuters' Web of Knowledge
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