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Exploration of power device reliability using compact device models and fast electrothermal simulation
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Bryant, Angus T., Mawby, P. A. (Philip A.), Palmer, Patrick R., Santi, Enrico and Hudgins, Jerry L. (2008) Exploration of power device reliability using compact device models and fast electrothermal simulation. In: 41st Annual Meeting of the IEEE Industry Applications Society, Tampa, FL, Oct 08-12, 2006. Published in: IEEE Transactions on Industry Applications, Vol.44 (No.3). pp. 894-903. doi:10.1109/TIA.2008.921388 ISSN 0093-9994.
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Official URL: http://dx.doi.org/10.1109/TIA.2008.921388
Abstract
This paper presents the application of compact insulated gate bipolar transistor and p-i-n diode models, including features such as local lifetime control and field-stop technology, to the full electrothermal system simulation of a hybrid electric vehicle converter using a lookup table of device losses. The vehicle converter is simulated with an urban driving cycle (the Federal Urban Driving Schedule), which is used to generate transient device temperature profiles. A methodology is also described to explore the converter reliability using the temperature profile, with rainflow cycle counting techniques from material fatigue analysis. The effects of ambient temperature, driving style, and converter design on converter reliability are also investigated.
Item Type: | Conference Item (UNSPECIFIED) | ||||
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Subjects: | T Technology > TA Engineering (General). Civil engineering (General) T Technology > TK Electrical engineering. Electronics Nuclear engineering |
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Divisions: | Faculty of Science, Engineering and Medicine > Engineering > Engineering | ||||
Library of Congress Subject Headings (LCSH): | Insulated gate bipolar transistors, Power semiconductors -- Thermal properties -- Mathematical models, Power semiconductors -- Electric properties -- Mathematical models, Fatigue testing machines, Hybrid electric vehicles -- Reliability, Power electronics | ||||
Journal or Publication Title: | IEEE Transactions on Industry Applications | ||||
Publisher: | IEEE | ||||
ISSN: | 0093-9994 | ||||
Official Date: | May 2008 | ||||
Dates: |
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Volume: | Vol.44 | ||||
Number: | No.3 | ||||
Number of Pages: | 10 | ||||
Page Range: | pp. 894-903 | ||||
DOI: | 10.1109/TIA.2008.921388 | ||||
Status: | Peer Reviewed | ||||
Publication Status: | Published | ||||
Access rights to Published version: | Restricted or Subscription Access | ||||
Title of Event: | 41st Annual Meeting of the IEEE Industry Applications Society | ||||
Type of Event: | Conference | ||||
Location of Event: | Tampa, FL | ||||
Date(s) of Event: | Oct 08-12, 2006 |
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