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A dependability-driven system-level design approach for embedded systems
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UNSPECIFIED (2005) A dependability-driven system-level design approach for embedded systems. In: Design, Automation and Test in Europe Conference and Exhibition (DATE 05), Munich, GERMANY, MAR 07-11, 2005. Published in: DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, VOLS 1 AND 2, PROCEEDINGS pp. 372-377. ISBN 0-7695-2288-2. ISSN 1530-1591.
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Abstract
The objective of this paper is to introduce dependability as an optimization criterion in the system-level design process of embedded systems. Given the pervasiveness of embedded systems, especially in the area of highly dependable and safety-critical systems, it is imperative to directly consider dependability in the system level design process. This naturally leads to a multi-objective optimization problem, as cost and time have to be considered too. This paper proposes a genetic algorithm to solve this multi-objective optimization problem and to determine a set of Pareto optimal design alternatives in a single optimization run. Based on these alternatives, the designer can choose his best solution, finding the desired tradeoff between cost, schedulability, and dependability.
Item Type: | Conference Item (UNSPECIFIED) | ||||
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Subjects: | Q Science > QA Mathematics > QA76 Electronic computers. Computer science. Computer software T Technology > TK Electrical engineering. Electronics Nuclear engineering |
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Series Name: | Design, Automation and Test in Europe Conference and Expo | ||||
Journal or Publication Title: | DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, VOLS 1 AND 2, PROCEEDINGS | ||||
Publisher: | IEEE COMPUTER SOC | ||||
ISBN: | 0-7695-2288-2 | ||||
ISSN: | 1530-1591 | ||||
Editor: | Wehn, N and Benini, L | ||||
Official Date: | 2005 | ||||
Dates: |
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Number of Pages: | 6 | ||||
Page Range: | pp. 372-377 | ||||
Publication Status: | Published | ||||
Title of Event: | Design, Automation and Test in Europe Conference and Exhibition (DATE 05) | ||||
Location of Event: | Munich, GERMANY | ||||
Date(s) of Event: | MAR 07-11, 2005 |
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