Kennedy, Leslie W. (1978) Large scale integrated (LSI) bipolar circuits : a study of integrated injection logic. PhD thesis, University of Warwick.

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Abstract

This thesis is a description of integrated injection logic,
a bipolar large scale integration technique.
Various alternatives to integrated injection logic are
discussed and the advantages and disadvantages of each are
outlined. The integrated injection logic structure is introduced
and its advantages over other solutions are described.
Those device characteristics necessary for successful
operation of the integrated injection logic gate are
established, and the physical mechanisms controlling D. C. and
A. C. performance are investigated theoretically. These
theoretical investigations are compared with experimental
observations.
The behaviour of the I2L gate is shown to be very
dependent on the characteristics of the epitaxial emitter
and the intrinsic base region of the device. In an
extension to the basic device theory it is shown that the
device characteristics can be related to the transistor
characteristics in the conventional mode of operation.
As the technique is primarily for large scale integration
a considerable effort has been placed on yield studies. These
yield studies have included work on the following: parametric
control, photoengraving and silicon crystallographic defects.
Silicon crystallographic defects are shown to be a major
yield hazard and appropriate actions to eliminate them as
failure mechanisms are described.

Item Type:	Thesis (PhD)
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering
Library of Congress Subject Headings (LCSH):	Integrated injection logic, Bipolar integrated circuits
Official Date:	1978
Dates:	Date Event 1978 Submitted
Institution:	University of Warwick
Theses Department:	School of Engineering
Thesis Type:	PhD
Publication Status:	Unpublished
Supervisor(s)/Advisor:	Blatt, V. ; Sumerling, G.
Extent:	xv, 298 leaves
Language:	eng

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