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Scanning probe microscopy : taking a closer look at conductivity
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Macpherson, Julie V. (2011) Scanning probe microscopy : taking a closer look at conductivity. Nature Nanotechnology, Vol.6 (No.2). pp. 84-85. doi:10.1038/nnano.2011.8 ISSN 1748-3387.
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Official URL: http://dx.doi.org/10.1038/nnano.2011.8
Abstract
The formation of an atomic-scale metal filament at the end of an atomic force microscope will pave the way for higher-resolution imaging by AFMs with functionalized tips.
Item Type: | Journal Article | ||||
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Subjects: | Q Science > QD Chemistry | ||||
Divisions: | Faculty of Science, Engineering and Medicine > Science > Chemistry | ||||
Library of Congress Subject Headings (LCSH): | Scanning probe microscopy, Nanotechnology | ||||
Journal or Publication Title: | Nature Nanotechnology | ||||
Publisher: | Nature Publishing Group | ||||
ISSN: | 1748-3387 | ||||
Official Date: | February 2011 | ||||
Dates: |
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Volume: | Vol.6 | ||||
Number: | No.2 | ||||
Page Range: | pp. 84-85 | ||||
DOI: | 10.1038/nnano.2011.8 | ||||
Status: | Peer Reviewed | ||||
Publication Status: | Published | ||||
Access rights to Published version: | Restricted or Subscription Access |
Data sourced from Thomson Reuters' Web of Knowledge
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