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Impurity locking of dislocations in silicon
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Giannattasio, A., Murphy, S., Senkader, S., Falster, R. J. and Wilshaw, P. R. (2004) Impurity locking of dislocations in silicon. In: 206th Meeting of The Electrochemical Society, High Purity Silicon VIII, Honolulu, Hawaii, 3-8 Oct 2004. Published in: Proceedings of the 206th Meeting of The Electrochemical Society, High Purity Silicon VIII
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Official URL: http://www.electrochem.org/
Item Type: | Conference Item (Paper) | ||||
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Divisions: | Faculty of Science, Engineering and Medicine > Engineering > WMG (Formerly the Warwick Manufacturing Group) | ||||
Journal or Publication Title: | Proceedings of the 206th Meeting of The Electrochemical Society, High Purity Silicon VIII | ||||
Publisher: | ECS | ||||
Official Date: | 2004 | ||||
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Status: | Peer Reviewed | ||||
Publication Status: | Published | ||||
Access rights to Published version: | Restricted or Subscription Access | ||||
Conference Paper Type: | Paper | ||||
Title of Event: | 206th Meeting of The Electrochemical Society, High Purity Silicon VIII | ||||
Type of Event: | Other | ||||
Location of Event: | Honolulu, Hawaii | ||||
Date(s) of Event: | 3-8 Oct 2004 |
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