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Influence of series resistance determination on the extracted mobility in MOS transistors with Ge channel
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Jasiński, Jakub, Łukasiak, Lidia, Jakubowski, Andrzej, Casteleiro, Catarina, Whall, Terry E., Parker, Evan H. C., Myronov, Maksym and Leadley, D. R. (David R.) (2013) Influence of series resistance determination on the extracted mobility in MOS transistors with Ge channel. In: Electron Technology Conference 2013, Ryn, Poland, April 16, 2013. Published in: SPIE Proceedings, 8902 doi:10.1117/12.2031269 ISSN 0277-786X.
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Official URL: http://dx.doi.org/10.1117/12.2031269
| Item Type: | Conference Item (Paper) | ||||
|---|---|---|---|---|---|
| Divisions: | Faculty of Science, Engineering and Medicine > Science > Physics | ||||
| Journal or Publication Title: | SPIE Proceedings | ||||
| Publisher: | SPIE | ||||
| ISSN: | 0277-786X | ||||
| Book Title: | Electron Technology Conference 2013 | ||||
| Editor: | Szczepanski, Pawel and Kisiel, Ryszard and Romaniuk, Ryszard S. | ||||
| Official Date: | 25 July 2013 | ||||
| Dates: |
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| Volume: | 8902 | ||||
| Article Number: | 89020O | ||||
| DOI: | 10.1117/12.2031269 | ||||
| Status: | Peer Reviewed | ||||
| Publication Status: | Published | ||||
| Access rights to Published version: | Restricted or Subscription Access | ||||
| Conference Paper Type: | Paper | ||||
| Title of Event: | Electron Technology Conference 2013 | ||||
| Type of Event: | Conference | ||||
| Location of Event: | Ryn, Poland | ||||
| Date(s) of Event: | April 16, 2013 |
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