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Energy loss rates of two-dimensional hole gases in inverted Si/Si0.8Ge0.2 heterostructures

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Ansaripour, Ghassem, Braithwaite, Glyn, Myranov, Maksym, Mironov, O. A., Parker, Evan H. C. and Whall, Terry E. (2000) Energy loss rates of two-dimensional hole gases in inverted Si/Si0.8Ge0.2 heterostructures. Applied Physics Letters, Vol.76 (No.9). pp. 1140-1142. doi:10.1063/1.125963 ISSN 0003-6951.

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Official URL: http://dx.doi.org/10.1063/1.125963

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Abstract

We have investigated the energy loss rate of hot holes as a function of carrier temperature TC in p-type inverted modulation-doped (MD) Si/SiGe heterostructures over the carrier sheet density range (3.5–13)×1011 cm–2, at lattice temperatures of 0.34 and 1.8 K. It is found that the energy loss rate (ELR) depends significantly upon the carrier sheet density, n2D. Such an n2D dependence of ELR has not been observed previously in p-type SiGe MD structures. The extracted effective mass decreases as n2D increases, which is in agreement with recent measurements on a gated inverted sample. It is shown that the energy relaxation of the two-dimensional hole gases is dominated by unscreened acoustic phonon scattering and a deformation potential of 3.0±0.4 eV is deduced.

Item Type: Journal Article
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Q Science > QC Physics
Divisions: Faculty of Science, Engineering and Medicine > Science > Physics
Library of Congress Subject Headings (LCSH): Silicon alloys, Germanium alloys, Semiconductors -- Junctions, Heterostructures, Hall effect, Electron mobility, Electron-phonon interactions
Journal or Publication Title: Applied Physics Letters
Publisher: American Institute of Physics
ISSN: 0003-6951
Official Date: 28 February 2000
Dates:
DateEvent
28 February 2000Published
Volume: Vol.76
Number: No.9
Page Range: pp. 1140-1142
DOI: 10.1063/1.125963
Status: Peer Reviewed
Access rights to Published version: Open Access (Creative Commons)
Funder: Iran. Majlis-i Shūrā-yi Islāmī [Iran. Islamic Consultative Assembly] (MSI)

Data sourced from Thomson Reuters' Web of Knowledge

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