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Number of items: 80.
2024
Ayala, Heaklig, Gonzalez, Jose Ortiz, Karout, Mohammed-Amer, Cotty, James, Rumney, Tim and Mawby, Philip. A. (2024) Inspection techniques using scanning acoustic microscopy for silver sintering applications in power electronic modules. In: 2023 24th European Microelectronics and Packaging Conference & Exhibition (EMPC), Cambridge, United Kingdom, 11-14 Sep 2023. Published in: 2023 24th European Microelectronics and Packaging Conference & Exhibition (EMPC) ISBN 9780956808691. doi:10.23919/empc55870.2023.10418309 (In Press)
Shen, Chengjun, Jahdi, Saeed, Munagala, Sai Priya, Simpson, Nick, Mellor, Phil, Alatise, Olayiwola M. and Gonzalez, Jose Ortiz (2024) Electrothermal power cycling of 15 kV SiC PiN diodes. Microelectronics Reliability, 153 . 115310. doi:10.1016/j.microrel.2023.115310 ISSN 0026-2714.
2023
Yu, Renze, Jahdi, Saeed, Alatise, Olayiwola M., Ortiz-Gonzalez, Jose Angel , Munagala, Sai Priya, Simpson, Nick and Mellor, Phil (2023) Measurements and review of failure mechanisms and reliability constraints of 4H-SiC Power MOSFETs under short circuit events. IEEE Transactions on Device and Materials Reliability, 23 (4). pp. 544-563. doi:10.1109/tdmr.2023.3316928 ISSN 1558-2574.
Alatise, Olayiwola M., Deb, Arkadeep, Bashar, Erfan, Ortiz Gonzalez, Jose Angel, Jahdi, Saeed and Issa, Walid (2023) A review of power electronic devices for heavy goods vehicles electrification : performance and reliability. Energies, 16 (11). 4380. doi:10.3390/en16114380 ISSN 1996-1073.
2022
Ortiz Gonzalez, Jose Angel, Deb, A., Bashar, Erfan, Agbo, S. N., Jahdi, S. and Alatise, Olayiwola M. (2022) Benchmarking the robustness of Si and SiC MOSFETs : unclamped inductive switching and short-circuit performance. Microelectronics Reliability, 138 . 114719. doi:10.1016/j.microrel.2022.114719 ISSN 00262714.
Shen, Chengjun, Yu, Renze, Jahdi, Saeed, Mellor, Phil, Munagala, Sai Priya, Hopkins, Andrew, Simpson, Nick, Ortiz-Gonzalez, Jose Angel and Alatise, Olayiwola M. (2022) FEM-based analysis of avalanche ruggedness of high voltage SiC Merged-PiN-Schottky and Junction-Barrier-Schottky diodes. Microelectronics Reliability, 138 . 114686. doi:10.1016/j.microrel.2022.114686 ISSN 0026-2714.
Gunaydin, Yasin, Jahdi, Saeed, Yuan, Xibo, Yu, Renze, Shen, Chengjun, Munagala, Sai Priya, Hopkins, Andrew, Simpson, Nick, Hosseinzadehlish, Mana, Ortiz-Gonzalez, Jose Angel and Alatise, Olayiwola M. (2022) Unclamped inductive stressing of GaN and SiC Cascode power devices to failure at elevated temperatures. Microelectronics Reliability, 138 . 114711. doi:10.1016/j.microrel.2022.114711 ISSN 0026-2714.
Issa, Walid, Ortiz Gonzalez, Jose Angel and Alatise, Olayiwola M. (2022) Design of a gate-driving cell for enabling extended SiC MOSFET voltage blocking. Energies, 15 (20). 7768. doi:10.3390/en15207768 ISSN 1996-1073.
Etoz, Burhan, Gonzalez, Jose Ortiz, Deb, Arkadeep, Jahdi, Saeed and Alatise, Olayiwola M. (2022) Impact of threshold voltage shifting on junction temperature sensing in GaN HEMTs. In: 24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe), Hanover, Germany, 05-09 Sep 2022. Published in: 2022 24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe) ISBN 9789075815399.
Mendy, Simon, Wu, Ruizhu, Ortiz Gonzalez, Jose Angel and Alatise, Olayiwola M. (2022) Electrothermal modelling and measurements of parallel-connected VTH mismatched SiC MOSFETs under inductive load switching. Materials Science Forum, 1062 . pp. 533-538. doi:10.4028/p-z4mz75 ISSN 1662-9752.
Zhang, L., Dai, Tianxiang, Gammon, Peter M., Lophitis, Neophytos , Udrea, Florin, Tiwari, Amit, Gonzalez, Jose Ortiz, Renz, A. B., Shah, Vishal, Mawby, Philip A. and Antoniou, Marina (2022) Investigations of short circuit robustness of SiC IGBTs with considerations on physics properties and design. Materials Science Forum, 1062 . pp. 504-508. doi:10.4028/p-13z22g ISSN 1662-9752.
Yang, Juefei, Jahdi, Saeed, Stark, Bernard, Mellor, Phil, Wu, Ruizhu, Alatise, Olayiwola M. and Ortiz-Gonzalez, Jose Angel (2022) Threshold voltage drift and on-resistance of SiC symmetrical and asymmetrical double-trench MOSFETs under gate bias stress. In: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, Nuremberg; Germany, 10-12 May 2022. Published in: PCIM Europe 2022 International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management Proceedings, 10 - 12 May 2022, Nuremberg pp. 1067-1072. ISBN 9783800758227. doi:10.30420/565822148 ISSN 2191-3358.
Gunaydin, Yasin, Jahdi, Saeed, Yuan, Xibo, Mellor, Phil, Stark, Bernard, Bashar, Erfan, Alatise, Olayiwola M. and Ortiz-Gonzalez, Jose Angel (2022) Transfer IV and threshold voltage drift of GaN and SiC cascode discrete devices under gate bias stress. In: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, Nuremberg; Germany, 10-12 May 2022. Published in: PCIM Europe 2022 International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management Proceedings, 10 - 12 May 2022, Nuremberg pp. 263-268. ISBN 9783800758227. doi:10.30420/565822039 ISSN 2191-3358.
Ortiz-Gonzalez, Jose Angel, Bashar, Erfan, Agbo, Nereus, Wu, Ruizhu, Mendy, Simon, Alatise, Olayiwola M., Jahdi, Saeed, Davies, Gareth, Withey, Andrew, Demitrova, Jana, Evans, Sam and Jennings, Mike (2022) A review of short circuit performance in 650 V power devices : SiC MOSFETs, silicon super-junction MOSFETs, SiC cascode JFETs, silicon MOSFETs and silicon IGBTs. In: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, Nuremberg; Germany, 10-12 May 2022. Published in: PCIM Europe 2022 International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management Proceedings, 10 - 12 May 2022, Nuremberg pp. 1167-1174. ISBN 9783800758227. doi:10.30420/565822162 ISSN 2191-3358.
Shen, Chengjun, Jahdi, Saeed, Yang, Juefei, Alatise, Olayiwola M., Ortiz-Gonzalez, Jose Angel , Wu, Ruizhu and Mellor, Phil (2022) Impact of carriers injection level on transients of discrete and paralleled silicon and 4H-SiC NPN BJTs. IEEE Open Journal of the Industrial Electronics Society, 3 . pp. 65-80. doi:10.1109/OJIES.2022.3143946 ISSN 2644-1284.
2021
Agbo, Sunday Nereus, Bashar, Erfan, Wu, Ruizhu, Mendy, Simon, Gonzalez, Jose Ortiz and Alatise, Olayiwola M. (2021) Simulations and measurements of failure modes in SiC Cascode JFETs under short circuit conditions. In: 2021 IEEE 22nd Workshop on Control and Modelling of Power Electronics (COMPEL), Cartagena, Colombia, 2-5 Nov 2021. Published in: 2021 IEEE 22nd Workshop on Control and Modelling of Power Electronics (COMPEL) pp. 1-7. doi:10.1109/COMPEL52922.2021.9646031 ISSN 1093-5142.
Bashar, Erfan, Wu, Ruizhu, Agbo, Nereus, Mendy, Simon, Jahdi, Saeed, Ortiz Gonzalez, Jose Angel and Alatise, Olayiwola M. (2021) Comparison of short circuit failure modes in SiC Planar MOSFETs, SiC trench MOSFETs and SiC Cascode JFETs. In: 2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA), Redondo Beach, CA, USA, 7-11 Nov 2021 pp. 384-388. ISBN 9781665401821. doi:10.1109/WiPDA49284.2021.9645092
Gonzalez, Jose Ortiz, Perez-Estevez, Diego, Wu, Ruizhu, Doval-Gandoy, Jesus and Alatise, Olayiwola M. (2021) Impact of Linear-PWM and MPC controllers on the power device losses in a grid-tied two-level inverter. In: 2021 23rd European Conference on Power Electronics and Applications (EPE'21 ECCE Europe), Ghent, Belgium, 6-10 Sep 2021. Published in: 2021 23rd European Conference on Power Electronics and Applications (EPE'21 ECCE Europe) pp. 1-10. doi:10.23919/EPE21ECCEEurope50061.2021.9570585 ISSN 9789075815375.
Renz, Arne Benjamin, Vavasour, Oliver James, Shah, Vishal Ajit, Pathirana, Vasantha, Trajkovic, Tanya, Bonyadi, Yeganeh, Wu, Ruizhu, Ortiz-Gonzalez, Jose Angel , Rong, Xiaoyun, Baker, Guy, Mawby, Philip. A. and Gammon, Peter M. (2021) 3.3 kV SiC JBS diodes employing a P2O5 surface passivation treatment to improve electrical characteristics. In: 2021 IEEE Energy Conversion Congress and Exposition (ECCE), Vancouver, BC, Canada, 10-14 Oct 2021 pp. 5283-5288. doi:10.1109/ECCE47101.2021.9594999 ISSN 2329-3721.
Gonzalez, Jose Ortiz, Perez-Estevez, Diego, Wu, Ruizhu, Doval-Gandoy, Jesus, Mawby, Philip. A. and Alatise, Olayiwola M. (2021) Power device losses in two-level converters with direct current controllers for grid connected applications. In: 2021 IEEE Energy Conversion Congress and Exposition (ECCE), Vancouver, BC, Canada, 10-14 Oct 2021. Published in: 2021 IEEE Energy Conversion Congress and Exposition (ECCE) pp. 3154-3159. ISBN 9781728151359. doi:10.1109/ECCE47101.2021.9595878
Yang, Juefei, Jahdi, Saeed, Stark, Bernard, Wu, Ruizhu, Alatise, Olayiwola M. and Ortiz Gonzalez, Jose Angel (2021) Impact of temperature and switching rate on properties of crosstalk on symmetrical & asymmetrical double-trench SiC power MOSFET. In: IECON 2021 β 47th Annual Conference of the IEEE Industrial Electronics Society, Toronto, ON, Canada, 13-16 Oct 2021 ISBN 9781665435543. doi:10.1109/IECON48115.2021.9589773 ISSN 2577-1647.
Wu, Ruizhu, Agbo, S. N., Mendy, Simon, Bashar, E., Jahdi, S., Ortiz Gonzalez, Jose Angel and Alatise, Olayiwola M. (2021) Measurement and simulation of short circuit current sharing under parallel connection : SiC MOSFETs and SiC Cascode JFETs. Microelectronics Reliability, 126 . 114271. doi:10.1016/j.microrel.2021.114271 ISSN 0026-2714.
Wu, Ruizhu, Mendy, Simon, Gonzalez, Jose Ortiz, Jahdi, Saeed and Alatise, Olayiwola M. (2021) Current sharing of parallel SiC MOSFETs under short circuit conditions. In: 2021 23rd European Conference on Power Electronics and Applications (EPE'21 ECCE Europe), Ghent, Belgium, 6-10 Sep 2021. Published in: 2021 23rd European Conference on Power Electronics and Applications (EPE'21 ECCE Europe) pp. 1-9. ISBN 9789075815375. doi:10.23919/EPE21ECCEEurope50061.2021.9570690
Wu, Ruizhu, Mendy, Simon, Agbo, Nereus, Gonzalez, Jose Ortiz, Jahdi, Saeed and Alatise, Olayiwola M. (2021) Performance of parallel connected SiC MOSFETs under short circuits conditions. Energies, 14 (20). 6834. doi:10.3390/en14206834 ISSN 1996-1073.
Gunaydin, Yasin, Jahdi, Saeed, Alatise, Olayiwola M., Ortiz Gonzalez, Jose Angel, Wu, Ruizhu, Stark, Bernard, Hedayati, Mohammad, Yuan, Xibo and Mellor, Phil (2021) Performance of wide-bandgap discrete and module cascodes at sub-1 kV : GaN vs. SiC. Microelectronics Reliability, 125 . 114362. doi:10.1016/j.microrel.2021.114362 ISSN 0026-2714.
Gunaydin, Y., Jahdi, Saeed, Alatise, Olayiwola M., Gonzalez, Jose Ortiz, Hedayati, M., Stark, B., Yang, J., Yuan, X. and Mellor, P. (2021) Impact of temperature and switching rate on forward and reverse conduction of GaN and SiC Cascode devices : a technology evaluation. In: The 10th International Conference on Power Electronics, Machines and Drives (PEMD 2020), 15-17 Dec 2020 pp. 782-787. doi:10.1049/icp.2021.1067
Shen, Chengjun, Jahdi, Saeed, Mellor, Phil, Yuan, Xibo, Alatise, Olayiwola M. and Ortiz-Gonzalez, Jose Angel (2021) Analysis of dynamic transients of high voltage silicon and 4H-SiC NPN BJTs. In: PCIM Europe digital days 2021, Virtual conference, 03-07 May 2021. Published in: PCIM Europe digital days 2021; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management ISBN 9783800755158.
Yang, Juefei, Jahdi, Saeed, Stark, Bernard, Mellor, Phil, Alatise, Olayiwola M. and Ortiz-Gonzalez, Jose Angel (2021) Investigation of performance of double-trench SiC Power MOSFETs in forward and reverse quadrant operation. In: PCIM Europe digital days 2021, Virtual conference, 03-07 May 2021. Published in: PCIM Europe digital days 2021; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management ISBN 9783800755158.
Yang, Juefei, Jahdi, Saeed, Stark, Bernard, Alatise, Olayiwola M., Ortiz-Gonzalez, Jose Angel and Mellor, Phil (2021) Analysis of the 1st and 3rd quadrant transients of symmetrical and asymmetrical double-trench SiC power MOSFETs. IEEE Open Journal of Power Electronics, 2 . pp. 265-276. doi:10.1109/ojpel.2021.3072503 ISSN 2644-1314.
Ortiz Gonzalez, Jose Angel and Alatise, Olayiwola M. (2021) Impact of BTI induced threshold voltage shifts in shoot-through currents from crosstalk in SiC MOSFETs. IEEE Transactions on Power Electronics, 36 (3). pp. 3279-3291. doi:10.1109/TPEL.2020.3012298 ISSN 0885-8993.
Shen, Chengjun, Jahdi, Saeed, Alatise, Olayiwola M., Ortiz-Gonzalez, Jose Angel , Aithal, Avinash and Mellor, Phil (2021) Prospects and challenges of 4H-SiC thyristors in protection of HB-MMC-VSC-HVDC converters. IEEE Open Journal of Power Electronics, 2 . pp. 145-154. doi:10.1109/ojpel.2021.3060942 ISSN 2644-1314.
2020
Ortiz Gonzalez, Jose Angel and Alatise, Olayiwola M. (2020) Bias temperature instability and junction temperature measurement using electrical parameters in SiC power MOSFETs. IEEE Transactions on Industry Applications . doi:10.1109/TIA.2020.3045120 ISSN 0093-9994.
Gunaydin, Yasin, Jahdi, Saeed, Alatise, Olayiwola M., Ortiz-Gonzalez, Jose Angel , Aithal, Avinash, Yuan, Xibo and Mellor, Phil (2020) Analysis of cyclic spontaneous switchings in GaN & SiC cascodes by snappy turn-off currents. Microelectronics Reliability, 114 . 113752. doi:10.1016/j.microrel.2020.113752 ISSN 0026-2714.
Agbo, S. N., Ortiz Gonzalez, Jose Angel, Wu, R., Jahdi, S. and Alatise, Olayiwola M. (2020) UIS performance and ruggedness of stand-alone and cascode SiC JFETs. Microelectronics Reliability, 114 . 113803. doi:10.1016/j.microrel.2020.113803 ISSN 0026-2714.
Gunaydin, Yasin, Jahdi, Saeed, Alatise, Olayiwola M., Gonzalez, Jose Ortiz, Wu, Ruizhu, Stark, Bernard, Hedayati, Mohammad, Yuan, Xibo and Mellor, Phil (2020) Performance of wide-bandgap gallium nitride vs silicon carbide cascode transistors. In: 2020 IEEE Energy Conversion Congress and Exposition (ECCE), Detroit, MI, USA, 11-15 Oct 2020 pp. 239-245. ISBN 9781728158266. doi:10.1109/ECCE44975.2020.9236187
Ortiz Gonzalez, Jose Angel, Wu, Robert, Jahdi, S. and Alatise, Olayiwola M. (2020) Performance and reliability review of 650V and 900V silicon and SiC devices : MOSFETs, cascode JFETs and IGBTs. IEEE Transactions on Industrial Electronics, 67 (9). pp. 7375-7385. doi:10.1109/TIE.2019.2945299 ISSN 0278-0046.
Agbo, S. N., Ortiz-Gonzalez, Jose Angel and Alatise, Olayiwola M. (2020) Performance of SiC cascode JFETs under single and repetitive avalanche pulses. Microelectronics Reliability, 110 . 113644. doi:10.1016/j.microrel.2020.113644 ISSN 0026-2714.
Gonzalez, Jose Ortiz, Alatise, Olayiwola M. and Mawby, Philip. A. (2020) Non-intrusive methodologies for characterization of bias temperature instability in SiC power MOSFETs. In: 2020 IEEE International Reliability Physics Symposium (IRPS), Dallas, TX, USA, 28 Apr -30 May 2020 ISBN 9781728131993. doi:10.1109/IRPS45951.2020.9129637
Wu, Ruizhu, Gonzalez, Jose Ortiz, Davletzhanova, Zarina, Mawby, Philip. A. and Alatise, Olayiwola M. (2020) Fast switching SiC cascode JFETs for EV traction inverters. In: Applied Power Electronics Conference and Exposition (APEC), Annual IEEE Conference, Virtual conference, 15-19 Mar 2020. Published in: 2020 IEEE Applied Power Electronics Conference and Exposition (APEC) pp. 3489-3496. ISBN 9781728148304. doi:10.1109/APEC39645.2020.9124052 ISSN 1048-2334.
Gonzalez, Jose Ortiz, Etoz, Burhan and Alatise, Olayiwola M. (2020) Characterizing threshold voltage shifts and recovery in Schottky gate and Ohmic gate GaN HEMTs. In: 2020 IEEE Energy Conversion Congress and Exposition (ECCE), Detroit, MI, USA, 11-15 Oct 2020 pp. 217-224. ISBN 9781728158266. doi:10.1109/ECCE44975.2020.9235650 ISSN 2329-3748.
Ortiz Gonzalez, Jose Angel, Etoz, Burhan and Alatise, Olayiwola M. (2020) Gate stresses and threshold voltage instability in normally OFF GaN HEMTs. In: 22nd European Conference on Power Electronics and Applications EPEβ20 ECCE Europe, Virtual, 7-11 Sep 2020 ISBN 9789075815368. doi:10.23919/EPE20ECCEEurope43536.2020.9215865
Gonzalez, Jose Ortiz, Wu, Ruizhu and Alatise, Olayiwola M. (2020) Trade-offs between gate oxide protection and performance in SiC MOSFETs. In: 2020 IEEE Energy Conversion Congress and Exposition (ECCE), Detroit, MI, USA, USA, 11-15 Oct 2020 pp. 690-697. ISBN 9781728158273. doi:10.1109/ECCE44975.2020.9235843
2019
Wu, Ruizhu, Gonzalez, Jose Ortiz, Davletzhanova, Zarina, Mawby, Philip. A. and Alatise, Olayiwola M. (2019) The potential of SiC Cascode JFETs in electric vehicle traction inverters. IEEE Transactions on Transportation Electrification, 5 (4). pp. 1349-1359. doi:10.1109/TTE.2019.2954654 ISSN 2372-2088.
Ortiz Gonzalez, Jose Angel and Alatise, Olayiwola M. (2019) Crosstalk in SiC power MOSFETs for evaluation of threshold voltage shift caused by bias temperature instability. In: 21st European Conference on Power Electronics and Applications - EPEβ19 ECCE β EUROPE Genoa, Genoa, Italy, 2-6 Sep 2019. Published in: 2019 21st European Conference on Power Electronics and Applications (EPE '19 ECCE Europe) ISBN 9789075815313. doi:10.23919/EPE.2019.8915508
Gonzalez, Jose Ortiz, Hedayati, M., Jahdi, S., Stark , B. H. and Alatise, Olayiwola M. (2019) Dynamic characterization of SiC and GaN devices with BTI stresses. Microelectronics Reliability, 100-101 . 113389. doi:10.1016/j.microrel.2019.06.081 ISSN 0026-2714.
Ortiz-Gonzalez, Jose Angel , Wu, Ruizhu, Nereus Agbo, Sunday and Alatise, Olayiwola M. (2019) Robustness and reliability review of Si and SiC FET devices for more-electric-aircraft applications. Microelectronics Reliability, 100-101 . 113324. doi:10.1016/j.microrel.2019.06.016 ISSN 0026-2714.
Ortiz Gonzalez, Jose Angel and Alatise, Olayiwola M. (2019) Challenges of junction temperature sensing in SiC power MOSFETs. In: 2019 10th International Conference on Power Electronics and ECCE Asia (ICPE 2019 - ECCE Asia), Busan, Korea (South), 27-30 May 2019 pp. 891-898.
Gonzalez, Jose Ortiz, Alatise, Olayiwola M. and Mawby, Philip. A. (2019) Novel method for evaluation of negative bias temperature instability of SiC MOSFETs. Materials Science Forum, 963 . pp. 749-752. doi:10.4028/www.scientific.net/MSF.963.749 ISSN 1662-9752.
Gonzalez, Jose Ortiz, Alatise, Olayiwola M. and Mawby, Philip. A. (2019) Characterization of BTI in SiC MOSFETs using third quadrant characteristics. In: 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD), Shanghai, China, 19-23 May 2019. Published in: 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD) pp. 207-210. ISBN 9781728105802. doi:10.1109/ISPSD.2019.8757624 ISSN 1946-0201.
Ortiz Gonzalez, Jose Angel and Alatise, Olayiwola M. (2019) A novel non-intrusive technique for BTI characterization in SiC MOSFETs. IEEE Transactions on Power Electronics, 34 (6). pp. 5737-5747. doi:10.1109/TPEL.2018.2870067 ISSN 0885-8993.
2018
Gonzalez, Jose Ortiz and Alatise, Olayiwola M. (2018) Impact of the gate oxide reliability of SiC MOSFETs on the junction temperature estimation using temperature sensitive electrical parameters. In: 2018 IEEE Energy Conversion Congress and Exposition (ECCE), Portland, OR, USA, 23-27 Sep 2018 pp. 837-844. ISBN 9781479973125. doi:10.1109/ECCE.2018.8557810 ISSN 2329-3748.
Davletzhanova, Zarina, Dai, Tianxiang, Alatise, Olayiwola M., Gonzalez, Jose Ortiz, Mawby, Philip. A., Bonyadi, Roozbeh and Chan, Chun Wa (2018) Safe-operating-area of snubberless series connected silicon and SiC power devices. In: Energy Conversion Congress and Exposition, ECCE, IEEE, Portland, OR, USA, 23-27 Sep 2018. Published in: 2018 IEEE Energy Conversion Congress and Exposition (ECCE) pp. 1875-1881. ISBN 9781479973132. doi:10.1109/ECCE.2018.8557402 ISSN 2329-3748.
Davletzhanova, Zarina, Alatise, Olayiwola M., Bonyadi, Roozbeh, Gonzalez, Jose Ortiz, Chan, Chun Wa, Bonyadi, Yeganeh, Jennings, Mike and Mawby, P. A. (Philip A.) (2018) Impact of Leakage Currents on Voltage Sharing in Series Connected SiC Power MOSFETs and Silicon IGBT Devices. In: 20th European Conference on Power Electronics and Applications, Riga, Latvia, 17-21 September 2018. Published in: 2018 20th European Conference on Power Electronics and Applications (EPE'18 ECCE Europe) ISBN 9781538641453 .
Ortiz Gonzalez, Jose Angel and Alatise, Olayiwola M. (2018) Bias temperature instability and condition monitoring in SiC power MOSFETs. Microelectronics Reliability, 88-90 . pp. 557-562. doi:10.1016/j.microrel.2018.06.045 ISSN 0026-2714.
Ortiz Gonzalez, Jose Angel and Alatise, Olayiwola M. (2018) Bias temperature instability and condition monitoring in SiC power MOSFETs. Microelectronics Reliability, 88-90 . pp. 557-562. doi:10.1016/j.microrel.2018.06.045 ISSN 0026-2714.
2017
Hu, Borong, Ortiz Gonzalez, Jose Angel, Ran, Li, Ren, Hai, Zeng, Zheng, Lai, Wei, Gao, Bing, Alatise, Olayiwola M., Lu, Hua, Bailey, Christopher and Mawby, P. A. (Philip A.) (2017) Failure and reliability analysis of a SiC power module based on stress comparison to a Si device. IEEE Transactions on Device and Materials Reliability, 17 (4). pp. 727-737. doi:10.1109/TDMR.2017.2766692 ISSN 1530-4388.
Ortiz Gonzalez, Jose Angel, Alatise, Olayiwola M., Aliyu, Attahir, Rajaguru, Pushparajah, Castellazzi, Alberto, Ran, Li, Mawby, P. A. (Philip A.) and Bailey, Chris (2017) Evaluation of SiC schottky diodes using pressure contacts. IEEE Transactions on Industrial Electronics, 64 (10). 8213 -8223. doi:10.1109/TIE.2017.2677348 ISSN 0278-0046.
Ortiz Gonzalez, Jose Angel, Alatise, Olayiwola M., Hu, Ji, Ran, Li and Mawby, P. A. (Philip A.) (2017) An investigation of temperature sensitive electrical parameters for SiC power MOSFETs. IEEE Transactions on Power Electronics, 32 (10). 7954 -7966. doi:10.1109/TPEL.2016.2631447 ISSN 0885-8993.
Ortiz Gonzalez, Jose Angel and Alatise, Olayiwola M. (2017) Impact of the gate driver voltage on temperature sensitive electrical parameters for condition monitoring of SiC power MOSFETs. Microelectronics Reliability, 76-77 . pp. 470-474. doi:10.1016/j.microrel.2017.06.082 ISSN 0026-2714.
Ortiz Gonzalez, Jose Angel, Alatise, Olayiwola M., Ran, Li and Mawby, P. A. (2017) Impact of temperature imbalance on junction temperature identification for multiple chip modules using TSEPs. In: PCIM Europe 2017; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, NΓΌrnberg, Deutschland, 16-18 May 2017 . Published in: Proceedings of PCIM Europe 2017; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management ISBN 9783800744244.
Ortiz Gonzalez, Jose Angel, Alatise, Olayiwola M., Mawby, P. A. (Philip A.), Aliyu, A. M. and Castellazzi, A. (2017) Pressure contact multi-chip packaging of SiC Schottky diodes. In: 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD), Sapporo, Japan, 28 May-1 Jun 2017. Published in: 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD) ISBN 9784886860941.
Ortiz Gonzalez, Jose Angel (2017) Electrothermal characterisation of silicon and silicon carbide power devices for condition monitoring. PhD thesis, University of Warwick.
Rajaguru, Pushparajah , Ortiz-Gonzalez, Jose Angel , Lu, Hua, Bailey, Chris and Alatise, Olayiwola M. (2017) A multiphysics modeling and experimental analysis of pressure contacts in power electronics applications. IEEE Transactions on Components, Packaging and Manufacturing Technology, 7 (6). pp. 893-900. doi:10.1109/TCPMT.2017.2688021 ISSN 2156-3950.
Ortiz Gonzalez, Jose Angel, Alatise, Olayiwola M., Ran, Li, Mawby, P. A. (Philip A.), Rajaguru, Pushparajah and Bailey, Christopher (2017) An initial consideration of silicon carbide devices in pressure-packages. In: 2016 IEEE Energy Conversion Congress and Exposition (ECCE), Milwaukee, WI, 18-22 Sep 2016. Published in: 2016 IEEE Energy Conversion Congress and Exposition (ECCE) ISBN 9781509007370.
2016
Ortiz Gonzalez, Jose Angel, Alatise, Olayiwola M., Nobeen, Nadeesh, Hu, Ji, Ran, Li and Mawby, P. A. (Philip A.) (2016) Electrothermal considerations for power cycling in SiC technologies. In: 9th International Conference on Integrated Power Electronics Systems, Nuremberg, Germany, 08-10 Mar 2016. Published in: Proceedings of CIPS 2016; 9th International Conference on Integrated Power Electronics Systems, 2016 ISBN 9783800741717.
Ortiz Gonzalez, Jose Angel, Ran, Li, Mohamed Motalab Ali Soli, A., Davletzhanova, Zarina, Alatise, Olayiwola M., Mawby, P. A. (Philip A.), Borong, Hu, Zheng, Zeng, Hai, Ren, Li, Hui and Shengyou, Xu (2016) Enabling high reliability power modules : a multidisciplinary task. In: International Symposium on 3D Power Electronics Integration and Manufacturing, McKimmon Center, Raleigh, NC, USA, 13-15 June 2016 ISBN 9781509029402.
Ortiz Gonzalez, Jose Angel, Aliyu, A. M., Alatise, Olayiwola M., Castellazzi, A., Ran, Li and Mawby, P. A. (Philip A.) (2016) Development and characterisation of pressed packaging solutions for high-temperature high-reliability SiC power modules. Microelectronics Reliability, 64 . pp. 434-439. ISSN 0026-2714.
Hu, Ji, Alatise, Olayiwola M., Ortiz Gonzalez, Jose Angel, Alexakis, Petros, Ran, Li and Mawby, P. A. (2016) Robustness and balancing of parallel connected power devices : SiC vs. CoolMOS. IEEE Transactions on Industrial Electronics, 63 (4). pp. 2092-2102. doi:10.1109/TIE.2015.2500187 ISSN 0278-0046.
Ortiz Gonzalez, Jose Angel, Alatise, Olayiwola M., Hu, Ji, Ran, Li and Mawby, P. A. (Philip A.) (2016) Temperature sensitive electrical parameters for condition monitoring in SiC power MOSFETs. In: 8th IET International Conference on Power Electronics, Machines and Drives (PEMD 2016), Glasgow, UK, 19-21 April 2016. Published in: 8th IET International Conference on Power Electronics, Machines and Drives (PEMD 2016) ISBN 9781785611889.
2015
Bonyadi, Roozbeh, Alatise, Olayiwola M., Jahdi, Saeed, Hu, Ji, Ortiz Gonzalez, Jose Angel, Ran, Li and Mawby, P. A. (2015) Compact electrothermal reliability modeling and experimental characterization of bipolar latchup in SiC and CoolMOS power MOSFETs. IEEE Transactions on Power Electronics, 30 (12). pp. 6978-6992. doi:10.1109/TPEL.2015.2388512 ISSN 0885-8993.
Jahdi, Saeed, Alatise, Olayiwola M., Ortiz Gonzalez, Jose Angel, Ran, Li and Mawby, P. A. (Philip A.) (2015) Comparative analysis of false turn-ON in silicon bipolar and SiC unipolar power devices. In: Energy Conversion Congress and Exposition (ECCE), 2015 IEEE, 20-24 Sept 2015, Montreal, QC. Published in: 2015 IEEE Energy Conversion Congress and Exposition (ECCE) pp. 2239-2246. ISBN 9781467371513. doi:10.1109/ECCE.2015.7309975 ISSN 2329-3721.
Jahdi, Saeed, Alatise, Olayiwola M., Ortiz Gonzalez, Jose Angel, Gammon, P. M., Ran, Li and Mawby, P. A. (Philip A.) (2015) Investigation of parasitic turn-ON in silicon IGBT and Silicon Carbide MOSFET devices : a technology evaluation. In: Power Electronics and Applications (EPE'15 ECCE-Europe), 2015 17th European Conference on, Geneva, Switzerland, 8-10 Sep 2015. Published in: 2015 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe) ISBN 9789075815221. doi:10.1109/EPE.2015.7309093
Bonyadi, Roozbeh, Alatise, Olayiwola M., Jahdi, Saeed, Ortiz Gonzalez, Jose Angel, Davletzhanova, Zarina, Ran, Li, Michaelides, Alexandros and Mawby, P. A. (Philip A.) (2015) Physics-based modelling and experimental characterisation of parasitic turn-on in IGBTs. In: Power Electronics and Applications (EPE'15 ECCE-Europe), 2015 17th European Conference on, Geneva, Switzerland, 8-10 Sep 2015. Published in: 2015 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe) ISBN 9789075815221. doi:10.1109/EPE.2015.7309179
Jahdi, Saeed, Alatise, Olayiwola M., Ortiz Gonzalez, Jose Angel, Bonyadi, Roozbeh, Ran, Li and Mawby, P. A. (Philip A.) (2015) Temperature and switching rate dependence of crosstalk in Si-IGBT and SiC power modules. IEEE Transactions on Industrial Electronics, 63 (2). pp. 849-863. doi:10.1109/TIE.2015.2491880 ISSN 0278-0046.
Hu, Ji, Alatise, Olayiwola M., Ortiz Gonzalez, Jose Angel, Bonyadi, Roozbeh, Ran, Li and Mawby, P. A. (2015) The effect of electrothermal nonuniformities on parallel connected SiC power devices under unclamped and clamped inductive switching. IEEE Transactions on Power Electronics, 31 (6). pp. 4526-4535. doi:10.1109/TPEL.2015.2477831 ISSN 0885-8993.
Alexakis, Petros, Alatise, Olayiwola M., Hu, Ji, Jahdi, Saeed, Ortiz Gonzalez, Jose Angel, Ran, Li and Mawby, P. A. (Philip A.) (2015) Analysis of power device failure under avalanche mode conduction. In: Power Electronics and ECCE Asia (ICPE-ECCE Asia), 2015 9th International Conference on, Seoul, South Korea, 1-5 Jun 2015. Published in: 2015 9th International Conference on Power Electronics and ECCE Asia (ICPE-ECCE Asia) pp. 1833-1839. ISBN 9788957082546. doi:10.1109/ICPE.2015.7168028 ISSN 2150-6078 .
Bonyadi, Roozbeh, Alatise, Olayiwola M., Jahdi, Saeed, Ortiz Gonzalez, Jose Angel, Ran, Li and Mawby, P. A. (Philip A.) (2015) Modeling of temperature dependent parasitic gate turn-on in silicon IGBTs. In: Power Electronics and ECCE Asia (ICPE-ECCE Asia), 2015 9th International Conference on, Seoul, South Korea, 1-5 Jun 2015. Published in: 2015 9th International Conference on Power Electronics and ECCE Asia (ICPE-ECCE Asia) pp. 560-566. ISBN 9788957082546. doi:10.1109/ICPE.2015.7167839 ISSN 2150-6078.
Jahdi, Saeed, Alatise, Olayiwola M., Bonyadi, Roozbeh, Alexakis, Petros, Fisher, Craig A., Ortiz Gonzalez, Jose Angel, Ran, Li and Mawby, P. A. (Philip A.) (2015) An analysis of the switching performance and robustness of power MOSFETs body diodes : a technology evaluation. IEEE Transactions on Power Electronics, Volume 30 (Number 5). pp. 2383-2394. doi:10.1109/TPEL.2014.2338792 ISSN 0885-8993.
Rajaguru, P., Lu, H., Bailey, C., Ortiz Gonzalez, Jose Angel and Alatise, Olayiwola M. (2015) Electro-thermo-mechanical modelling and analysis of the press pack diode in power electronics. In: Thermal Investigations of ICs and Systems (THERMINIC), 2015 21st International Workshop on, Paris, France, 30 Sept - 2 Oct 2015. Published in: 2015 21st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) pp. 1-6. doi:10.1109/THERMINIC.2015.7389607
Hu, Ji, Alatise, Olayiwola M., Ortiz Gonzalez, Jose Angel, Alexakis, Petros, Ran, Li and Mawby, P. A. (Philip A.) (2015) Finite element modelling and experimental characterisation of paralleled SiC MOSFET failure under avalanche mode conduction. In: Power Electronics and Applications (EPE'15 ECCE-Europe), 2015 17th European Conference on, Geneva, Switzerland, 8-10 Sep 2015. Published in: 2015 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe) pp. 1-9. doi:10.1109/EPE.2015.7309180
This list was generated on Tue Mar 19 04:05:22 2024 GMT.