Al-Amin, Mohammad, Barai, Anup, Ashwin, T. R. and Marco, James (2021) An insight to the degradation behaviour of the parallel connected lithium-ion battery cells. Energies, 14 . 4716. doi:10.3390/en14164716 ISSN 1996-1073.

Grant, Nicholas E., Scowcroft, Jennifer R., Pointon, A. I., Al-Amin, Mohammad, Altermatt, Pietro P. and Murphy, John D. (2020) Lifetime instabilities in gallium doped monocrystalline PERC silicon solar cells. Solar Energy Materials and Solar Cells, 206 . 110299. doi:10.1016/j.solmat.2019.110299 ISSN 0927-0248.

Grant, Nicholas E., Scowcroft, Jennifer R., Pointon, A. I., Al-Amin, Mohammad, Altermatt, Pietro P. and Murphy, John D. (2019) Data for Lifetime instabilities in gallium doped monocrystalline PERC silicon solar cells. [Dataset]

Al-Amin, Mohammad, Grant, Nicholas E., Pointon, A. I. and Murphy, J. D. (2019) Iodine-ethanol surface passivation for measurement of millisecond carrier lifetimes in silicon wafers with different crystallographic orientations. Physica Status Solidi A, 216 (17). 1900257. doi:10.1002/pssa.201900257 ISSN 1862-6300.

Al-Amin, Mohammad, Grant, Nicholas E., Pointon, A. I. and Murphy, J. D. (2019) Data for Iodine-ethanol surface passivation for measurement of millisecond carrier lifetimes in silicon wafers with different crystallographic orientations. [Dataset]

Al-Amin, Mohammad and Murphy, John D. (2017) Combining low-temperature gettering with phosphorus diffusion gettering for improved multicrystalline silicon. IEEE Journal of Photovoltaics, 7 (6). 1519 -1527. doi:10.1109/JPHOTOV.2017.2741100 ISSN 2156-3381.

Grant, Nicholas E., Niewelt, Tim, Wilson, Neil R., Wheeler-Jones, Evé, Bullock, James, Al-Amin, Mohammad, Schubert, Martin C., van Veen, André C., Javey, Ali and Murphy, John D. (2017) Superacid-treated silicon surfaces : extending the limit of carrier lifetime for photovoltaic applications. IEEE Journal of Photovoltaics, 7 (6). pp. 1574-1583. doi:10.1109/JPHOTOV.2017.2751511 ISSN 2156-3381.

Al-Amin, Mohammad, Grant, Nicholas E. and Murphy, John D. (2017) Low-temperature saw damage gettering to improve minority carrier lifetime in multicrystalline silicon. Physica Status Solidi Rapid Research Letters, 11 (10). 1700268. ISSN 1862-6270.

Grant, Nicholas E., Niewelt, Tim, Wilson, Neil R., Wheeler-Jones, Evé, Bullock, James, Al-Amin, Mohammad, Schubert, Martin C., van Veen, André C., Javey, Ali and Murphy, John D. (2017) Data for Superacid-Treated Silicon Surfaces: Extending the Limit of Carrier Lifetime for Photovoltaic Applications. [Dataset]

Al-Amin, Mohammad, Grant, Nicholas E. and Murphy, John D. (2017) Data for Low-temperature saw damage gettering to improve minority carrier lifetime in multicrystalline silicon. [Dataset]

Al-Amin, Mohammad and Murphy, John D. (2017) Data for Combining low-temperature gettering with phosphorus diffusion gettering for improved multicrystalline silicon. [Dataset]

Al-Amin, Mohammad (2017) Low-temperature gettering in multicrystalline silicon materials for photovoltaics. PhD thesis, University of Warwick.

Al-Amin, Mohammad and Murphy, John D. (2017) Passivation effects on low-temperature gettering in multicrystalline silicon. IEEE Journal of Photovoltaics, 7 (1). pp. 68-77. ISSN 2156-3381.

Al-Amin, Mohammad and Murphy, John D. (2016) Hydrogenation effect on low temperature internal gettering in multicrystalline silicon. In: 43rd IEEE Photovoltaic Specialists Conference, Portland, Oregon, USA, 5-10 Jun 2016. Published in: Proceedings of the 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) 0585-0590. ISBN 9781509027255.

Al-Amin, Mohammad and Murphy, John D. (2016) Data for Passivation effects on low temperature gettering in multicrystalline silicon. [Dataset]

Al-Amin, Mohammad and Murphy, John D. (2016) Increasing minority carrier lifetime in as-grown multicrystalline silicon by low temperature internal gettering. Journal of Applied Physics, 119 (23). 235704. doi:10.1063/1.4954010 ISSN 0021-8979.

Al-Amin, Mohammad and Murphy, John D. (2016) Data for Increasing minority carrier lifetime in as-grown multicrystalline silicon by low temperature internal gettering. [Dataset]

Al-Amin, Mohammad and Murphy, John D. (2016) Low temperature internal gettering of bulk defects in silicon photovoltaic materials. Solid State Phenomena, 242 . pp. 109-119. doi:10.4028/www.scientific.net/SSP.242.109 ISSN 1662-9779.

Murphy, John D., Al-Amin, Mohammad, Bothe, K., Olmo, M., Voronkov, V. V. and Falster, R. J. (2015) The effect of oxide precipitates on minority carrier lifetime in n-type silicon. Journal of Applied Physics, 118 . 215706. doi:10.1063/1.4936852 ISSN 0021-8979.