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Number of items: 9.
Australian Renewable Energy Agency
Grant, Nicholas E., Markevich, Vladimir, Mullins, Jack, Peaker, Anthony R., Rougieux, Fiacre E., Macdonald, Daniel and Murphy, John D. (2016) Permanent annihilation of thermally activated defects which limit the lifetime of float-zone silicon. Physica Status Solidi A, 213 (11). pp. 2844-2849. doi:10.1002/pssa.201600360 ISSN 1862-6300.
Rougieux, Fiacre E., Grant, Nicholas E., Barugkin, Chug, Macdonald, Daniel and Murphy, John D. (2015) Influence of annealing and bulk hydrogenation on lifetime-limiting defects in nitrogen-doped floating zone silicon. IEEE Journal of Photovoltaics, 5 (2). pp. 495-498. doi:10.1109/JPHOTOV.2014.2367912
Australian Research Council (ARC)
Grant, Nicholas E., Markevich, Vladimir, Mullins, Jack, Peaker, Anthony R., Rougieux, Fiacre E., Macdonald, Daniel and Murphy, John D. (2016) Permanent annihilation of thermally activated defects which limit the lifetime of float-zone silicon. Physica Status Solidi A, 213 (11). pp. 2844-2849. doi:10.1002/pssa.201600360 ISSN 1862-6300.
Rougieux, Fiacre E., Grant, Nicholas E., Barugkin, Chug, Macdonald, Daniel and Murphy, John D. (2015) Influence of annealing and bulk hydrogenation on lifetime-limiting defects in nitrogen-doped floating zone silicon. IEEE Journal of Photovoltaics, 5 (2). pp. 495-498. doi:10.1109/JPHOTOV.2014.2367912
Deutschland Bundesministerium für Wirtschaft und Energie [German Federal Ministry for Economic Affairs and Energy] (BMWi)
Niewelt, T., Selinger, M., Grant, Nicholas E., Kwapil, W. M., Murphy, John D. and Schubert, M. C. (2017) Light-induced activation and deactivation of bulk defects in boron-doped float-zone silicon. Journal of Applied Physics, 121 (18). 185702. ISSN 0021-8979.
Engineering and Physical Sciences Research Council (EPSRC)
Grant, Nicholas E. and Murphy, John D. (2017) Temporary surface passivation for characterisation of bulk defects in silicon : a review. Physica Status Solidi Rapid Research Letters, 11 (11). 1700243. doi:10.1002/pssr.201700243 ISSN 1862-6270.
Niewelt, T., Selinger, M., Grant, Nicholas E., Kwapil, W. M., Murphy, John D. and Schubert, M. C. (2017) Light-induced activation and deactivation of bulk defects in boron-doped float-zone silicon. Journal of Applied Physics, 121 (18). 185702. ISSN 0021-8979.
Grant, Nicholas E., Markevich, Vladimir, Mullins, Jack, Peaker, Anthony R., Rougieux, Fiacre E., Macdonald, Daniel and Murphy, John D. (2016) Permanent annihilation of thermally activated defects which limit the lifetime of float-zone silicon. Physica Status Solidi A, 213 (11). pp. 2844-2849. doi:10.1002/pssa.201600360 ISSN 1862-6300.
Rougieux, Fiacre E., Grant, Nicholas E., Barugkin, Chug, Macdonald, Daniel and Murphy, John D. (2015) Influence of annealing and bulk hydrogenation on lifetime-limiting defects in nitrogen-doped floating zone silicon. IEEE Journal of Photovoltaics, 5 (2). pp. 495-498. doi:10.1109/JPHOTOV.2014.2367912
This list was generated on Thu Mar 28 22:55:34 2024 GMT.