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Group by: Official Date | Item Type | Funder | No Grouping
Jump to: 2022 | 2021 | 2020
Number of items: 8.

2022

Ortiz Gonzalez, Jose Angel, Deb, A., Bashar, Erfan, Agbo, S. N., Jahdi, S. and Alatise, Olayiwola M. (2022) Benchmarking the robustness of Si and SiC MOSFETs : unclamped inductive switching and short-circuit performance. Microelectronics Reliability . 114719. doi:10.1016/j.microrel.2022.114719 ISSN 00262714. (In Press)

Gunaydin, Yasin, Jahdi, Saeed, Yuan, Xibo, Mellor, Phil, Stark, Bernard, Bashar, Erfan, Alatise, Olayiwola M. and Ortiz-Gonzalez, Jose Angel (2022) Transfer IV and threshold voltage drift of GaN and SiC cascode discrete devices under gate bias stress. In: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, Nuremberg; Germany, 10-12 May 2022. Published in: PCIM Europe 2022 International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management Proceedings, 10 - 12 May 2022, Nuremberg pp. 263-268. ISBN 9783800758227. doi:10.30420/565822039 ISSN 2191-3358.

Ortiz-Gonzalez, Jose Angel, Bashar, Erfan, Agbo, Nereus, Wu, Ruizhu, Mendy, Simon, Alatise, Olayiwola M., Jahdi, Saeed, Davies, Gareth, Withey, Andrew, Demitrova, Jana, Evans, Sam and Jennings, Mike (2022) A review of short circuit performance in 650 V power devices : SiC MOSFETs, silicon super-junction MOSFETs, SiC cascode JFETs, silicon MOSFETs and silicon IGBTs. In: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, Nuremberg; Germany, 10-12 May 2022. Published in: PCIM Europe 2022 International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management Proceedings, 10 - 12 May 2022, Nuremberg pp. 1167-1174. ISBN 9783800758227. doi:10.30420/565822162 ISSN 2191-3358.

2021

Agbo, Sunday Nereus, Bashar, Erfan, Wu, Ruizhu, Mendy, Simon, Gonzalez, Jose Ortiz and Alatise, Olayiwola M. (2021) Simulations and measurements of failure modes in SiC Cascode JFETs under short circuit conditions. In: 2021 IEEE 22nd Workshop on Control and Modelling of Power Electronics (COMPEL), Cartagena, Colombia, 2-5 Nov 2021. Published in: 2021 IEEE 22nd Workshop on Control and Modelling of Power Electronics (COMPEL) pp. 1-7. doi:10.1109/COMPEL52922.2021.9646031 ISSN 1093-5142.

Bashar, Erfan, Wu, Ruizhu, Agbo, Nereus, Mendy, Simon, Jahdi, Saeed, Ortiz Gonzalez, Jose Angel and Alatise, Olayiwola M. (2021) Comparison of short circuit failure modes in SiC Planar MOSFETs, SiC trench MOSFETs and SiC Cascode JFETs. In: 2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA), Redondo Beach, CA, USA, 7-11 Nov 2021 pp. 384-388. ISBN 9781665401821. doi:10.1109/WiPDA49284.2021.9645092

Wu, Ruizhu, Agbo, S. N., Mendy, Simon, Bashar, E., Jahdi, S., Ortiz Gonzalez, Jose Angel and Alatise, Olayiwola M. (2021) Measurement and simulation of short circuit current sharing under parallel connection : SiC MOSFETs and SiC Cascode JFETs. Microelectronics Reliability, 126 . 114271. doi:10.1016/j.microrel.2021.114271 ISSN 0026-2714.

Renz, A. B., Vavasour, Oliver J., Gammon, P. M., Li, Fan, Dai, Tianxiang, Antoniou, M., Baker, G. W. C., Bashar, E., Grant, N. E, Murphy, J. D., Mawby, P. A. and Shah, V. A. (2021) The improvement of atomic layer deposited SiO2/4H-SiC interfaces via a high temperature forming gas anneal. Materials Science in Semiconductor Processing, 122 . 105527. doi:10.1016/j.mssp.2020.105527 ISSN 1369-8001.

2020

Bashar, E. (2020) A fast-acting protection scheme for series compensators in a medium-voltage network. PhD thesis, University of Warwick.

This list was generated on Sat Feb 4 09:33:47 2023 GMT.
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