Number of items: 1.
2021
Lachichi, Amel and Mawby, Philip. A.
(2021)
Bipolar degradation monitoring of 4H-SiC MOSFET power devices by electroluminescence measurements.
In: IECON 2021 – 47th Annual Conference of the IEEE Industrial Electronics Society, Toronto, ON, Canada , 13-16 Oct 2021
ISBN 9781665435543.
doi:10.1109/IECON48115.2021.9589563
ISSN 2577-1647.
This list was generated on Sat Jun 3 22:46:53 2023 BST.