2012

Swan, I. R. (Ian R.), Bryant, Angus T. and Mawby, P. A. (Philip A.) (2012) Fast 3D thermal simulation of power module packaging. International Journal of Numerical Modelling : Electronic Networks, Devices and Fields, Vol.25 (No.4). pp. 378-399. doi:10.1002/jnm.841

Donnellan, B. T., Roberts, G. J., Mawby, P. A. (Philip A.) and Bryant, Angus T. (2012) Modelling of current sharing in paralleled current limiting superjunction MOSFETs with common gate drives. Microelectronics Reliability, Vol.52 (No.3). pp. 497-502. doi:10.1016/j.microrel.2011.12.007

2011

Bryant, Angus T., Yang, Shaoyong, Mawby, P. A. (Philip A.), Xiang, Dawei, Ran, Li, Tavner, Peter and Palmer, Patrick R. (2011) Investigation into IGBT dV/dt during turn-off and its temperature dependence. IEEE Transactions on Power Electronics, Volume 26 (Number 10). pp. 3019-3031. doi:10.1109/TPEL.2011.2125803

Yang, Shaoyong, Bryant, Angus T., Mawby, P. A., Xiang, Dawei, Ran, Li and Tavner, Peter J. (2011) An industry-based survey of reliability in power electronic converters. IEEE Transactions on Industry Applications, Vol.47 (No.3). pp. 1441-1451. doi:10.1109/TIA.2011.2124436

2010

Lu, Liqing, Bryant, Angus T., Hudgins, Jerry L., Palmer, Patrick R. and Santi, Enrico (2010) Physics-based model of planar-gate IGBT Including MOS side two-dimensional effects. IEEE Transactions on Industry Applications, Vol.46 (No.6). pp. 2556-2567. doi:10.1109/TIA.2010.2071190

Lu, Liqing, Chen, Zhiyang, Bryant, Angus T., Hudgins, Jerry L., Palmer, Patrick R. and Santi, Enrico (2010) Modeling of MOS-Side carrier injection in trench-gate IGBTs. IEEE Transactions on Industry Applications, Vol.46 (No.2). pp. 875-883. doi:10.1109/TIA.2009.2039770

Du, Bin, Hudgins, Jerry L., Santi, Enrico, Bryant, Angus T., Palmer, Patrick R. and Mantooth, H. Alan (2010) Transient electrothermal simulation of power semiconductor devices. IEEE Transactions on Power Electronics, Vol.25 (No.1). pp. 237-248. doi:10.1109/TPEL.2009.2029105

Yang, Shaoyong, Xiang, Dawei, Bryant, Angus T., Mawby, P. A., Ran, Li and Tavner, Peter J. (2010) Condition monitoring for device reliability in power electronic converters : a review. IEEE Transactions on Power Electronics, Volume 25 (Number 11). pp. 2734-2752. doi:10.1109/TPEL.2010.2049377

Leong, K. K., Bryant, Angus T. and Mawby, P. A. (Philip A.) (2010) Power MOSFET operation at cryogenic temperatures : comparison between HEXFET (R), MDMesh (TM) and CoolMOS (TM). In: 22nd International Symposium on Power Semiconductor Devices and ICs, Hiroshima, Japan, 06-10 Jun 2010 . Published in: Proceedings of the International Symposium on Power Semiconductor Devices & ICs pp. 209-212. ISSN 1943-653X.

2009

Wang, Yalan, Palmer, Patrick R., Bryant, Angus T., Finney, Stephen J., Abu-Khaizaran, Muhammad S. and Li, Gangru (2009) An analysis of high-power IGBT switching under cascade active voltage control. In: 40th Annual Meeting of the IEEE Industry Applications Society, Hong Kong, People's Republic of China, October 02-06, 2005. Published in: IEEE Transactions on Industry Applications, Vol.45 (No.2). pp. 861-870. ISSN 0093-9994. doi:10.1109/TIA.2009.2013595

Swan, I. R. (Ian R.), Bryant, A. T., Parker-Allotey, Nii-Adotei and Mawby, P. A. (Philip A.) (2009) 3-D thermal simulation of power module packaging. In: IEEE Energy Conversion Congress and Exposition, San Jose, CA, Sepbember 20-24, 2009. Published in: 2009 IEEE Energy Conversion Congress and Exposition, Vols. 1-6 pp. 1185-1192. ISBN 978-1-4244-2892-2. doi:10.1109/ECCE.2009.5316235

Bryant, Angus T., Jennings, M. R., Parker-Allotey, Nii-Adotei, Mawby, P. A. (Philip A.), Pérez-Tomás, Amador, Brosselard, P., Godignon, P., Jorda, X., Milian, J., Palmer, P. R., Santi, E. and Hudgins, J. L. (2009) Physical modelling of large area 4H-SiC PiN diodes. In: IEEE Energy Conversion Congress and Exposition, San Jose, CA, September 20-24, 2009. Published in: 2009 IEEE Energy Conversion Congress and Exposition, Vols. 1-6 pp. 494-501. ISBN 978-1-4244-2892-2. doi:10.1109/ECCE.2009.5316233

Yang, Shaoyong, Bryant, Angus T., Mawby, P. A. (Philip A.), Xiang, Dawei, Ran, Li and Tavner, Peter (2009) An industry-based survey of reliability in power electronic converters. In: IEEE Energy Conversion Congress and Exposition, San Jose, CA, 20-24 Sep 2009. Published in: 2009 IEEE Energy Conversion Congress and Exposition, Vols. 1-6, Volume 1-6 pp. 2612-2618. ISBN 9781424428922. doi:10.1109/ECCE.2009.5316356

2008

Bryant, Angus T., Mawby, P. A. (Philip A.), Palmer, Patrick R., Santi, Enrico and Hudgins, Jerry L. (2008) Exploration of power device reliability using compact device models and fast electrothermal simulation. In: 41st Annual Meeting of the IEEE Industry Applications Society, Tampa, FL, Oct 08-12, 2006. Published in: IEEE Transactions on Industry Applications, Vol.44 (No.3). pp. 894-903. ISSN 0093-9994. doi:10.1109/TIA.2008.921388

Bryant, Angus T., Lu, Liqing, Santi, E. (Enrico), Hudgins, Jerry L. and Palmer, Patrick R. (2008) Modeling of IGBT resistive and inductive turn-on behavior. In: IEEE Industry Applications Society 40th Annual Meeting, Kowloon, Hong Kong , Oct 02-06, 2005. Published in: IEEE Transactions on Industry Applications, Vol.44 (No.3). pp. 904-914. ISSN 0093-9994. doi:10.1109/TIA.2008.921384

Bryant, Angus T., Lu, Liqing, Santi, Enrico, Palmer, Patrick R. and Hudgins, Jerry L. (2008) Physical modeling of fast p-i-n diodes with carrier lifetime zoning, part I : Device model. IEEE Transactions on Power Electronics, Vol.23 (No.1). pp. 189-197. doi:10.1109/TPEL.2007.911823

Lu, Liqing, Bryant, Angus T., Santi, E. (Enrico), Palmer, Patrick R. and Hudgins, Jerry L. (2008) Physical modeling of fast p-i-n diodes with carrier lifetime zoning, part II : Parameter extraction. IEEE Transactions on Power Electronics, Vol.23 (No.1). pp. 198-205. doi:10.1109/TPEL.2007.911825

Swan, I. R. (Ian R.), Bryant, Angus T. and Mawby, P. A. (Philip A.) (2008) Fast thermal models for power device packaging. In: IEEE Industry-Applications-Society Annual Meeting, Alberta, Canada, Oct 05-09, 2008. Published in: Industry Applications Society. IEEE - IAS Annual Meeting. Conference Record, Vol.1-5 pp. 1457-1464. ISBN 978-1-4244-2278-4. ISSN 0197-2618. doi:10.1109/08IAS.2008.359

2007

Bryant, Angus T., Palmer, Patrick R., Santi, Enrico and Hudgins, Jerry L. (2007) Simulation and optimization of diode and insulated gate bipolar transistor interaction in a chopper cell using MATLAB and Simulink. IEEE Transactions on Industry Applications, Vol.43 (No.4). pp. 874-883. doi:10.1109/TIA.2007.900443

Bryant, Angus T., Parker-Allotey, Nii-Adotei and Palmer, Patrick R. (2007) The use of condition maps in the design and testing of power electronic circuits and devices. IEEE Transactions on Industry Applications, Vol.43 (No.4). pp. 902-910. doi:10.1109/TIA.2007.900470

Bryant, Angus T., Wang, Yalan, Finney, Stephen J., Lim, Tee Chong and Palmer, Patrick R. (2007) Numerical optimization of an active voltage controller for high-power IGBT converters. IEEE Transactions on Power Electronics, Vol.22 (No.2). pp. 374-383. doi:10.1109/TPEL.2006.889895

Bryant, A. T., Roberts, G. J., Walker, A. and Mawby, P. A. (Philip A.) (2007) Fast inverter loss simulation and silicon carbide device evaluation for hybrid electric vehicle drives. In: 4th Power Conversion Conference (PCC-Nagoya 2007), Nagoya, Japan, 2-5 Apr 2007. Published in: 2007 Power Conversion Conference - Nagoya, Vols 1-3 pp. 1017-1024. ISBN 9781424408436.