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Journal Article
Belykh, S. F., Palitsin, V. V., Veryovkin, I. V., Kovarsky, A. P., Chang, R. J. H., Adriaens, A. (Annemie), Dowsett, M. G. and Adams, F. (2007) New Cs sputter ion source with polyatomic ion beams for secondary ion mass spectrometry applications. Review of Scientific Instruments, Vol.78 (No.8). Article: 085101. doi:10.1063/1.2761021 ISSN 0034-6748.