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Seoane, N., Indalecio, G., Aldegunde, Manuel, Nagy, Daniel, Elmessary, Muhammad A., Garcia-Loureiro, Antonio J. and Kalna, Karol (2016) Comparison of fin-edge roughness and metal grain work function variability in InGaAs and Si FinFETs. IEEE Transactions on Electron Devices, 63 (3). pp. 1209-1215. doi:10.1109/TED.2016.2516921
