Number of items: 1.
Belikh, S. F., Palitsin, V., Veryovkin, I. V., Kovarsky, A. P., Chang, R. J. H., Adriaens, A. (Annemie), Dowsett, M. and Adams, F.
(2006)
Caesium sputter ion source compatible with commercial SIMS instruments.
In: 15th International Conference on Secondary Ion Mass Spectrometry (SIMS XV), Univ Manchester, Manchester, 12-16 Sep 2005. Published in: Applied Surface Science, Volume 252
(Number 19 ).
pp. 7321-7325.
doi:10.1016/j.apsusc.2006.02.172
ISSN 0169-4332.
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