Belikh, S. F., Palitsin, V., Veryovkin, I. V., Kovarsky, A. P., Chang, R. J. H., Adriaens, A. (Annemie), Dowsett, M. and Adams, F. (2006) Caesium sputter ion source compatible with commercial SIMS instruments. In: 15th International Conference on Secondary Ion Mass Spectrometry (SIMS XV), Univ Manchester, Manchester, 12-16 Sep 2005. Published in: Applied Surface Science, Volume 252 (Number 19 ). pp. 7321-7325. ISSN 0169-4332. doi:10.1016/j.apsusc.2006.02.172